MICROPROBE, INC.

Patent Owner

Watch Compare Add to Portfolio

Stats

Details

Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 29130
 
  
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 1132

Top Patents (by citation)

Upgrade to the Professional Level to View Top Patents for this Owner. Learn More

Recent Publications

  • No Recent Publications to Display

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
RE46221 Probe skates for electrical testing of convex pad topologiesJul 10, 12Nov 29, 16[G01R]
9476911 Probes with high current carrying capability and laser machining methodsMar 19, 12Oct 25, 16[G01R]
9250266 Probe bonding method having improved control of bonding materialJul 25, 12Feb 02, 16[G01R]
9121868 Probes with offset arm and suspension structureJun 19, 12Sep 01, 15[G01R]
9097740 Layered probes with coreFeb 09, 10Aug 04, 15[G01R]
8988091 Multiple contact probesSep 13, 10Mar 24, 15[G01R]
8907689 Probe retention arrangementAug 30, 10Dec 09, 14[G01R]
8829937 Fine pitch guided vertical probe array having enclosed probe flexuresJan 27, 11Sep 09, 14[G01R]
8723546 Vertical guided layered probeMar 02, 10May 13, 14[G01R]
RE44407 Space transformers employing wire bonds for interconnections with fine pitch contactsDec 23, 09Aug 06, 13[G01R]

View all patents..

Expired/Abandoned/Withdrawn Patents

  • No Patents to Display

Top Inventors for This Owner

Upgrade to the Professional Level to View Top Inventors for this Owner. Learn More

We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.