MEIWA e-TEC co., ltd.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 276
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 1197

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9163992 Abnormal measurement detection device and method for infrared radiation thermometerAug 06, 12Oct 20, 15[G01J]
8445847 Abnormal measurement detection device and method for infrared radiation thermometerMar 25, 08May 21, 13[G01J]
8340468 Temperature measuring device and temperature measuring methodMar 25, 08Dec 25, 12[G06K]

Expired/Abandoned/Withdrawn Patents

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Top Inventors for This Owner

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