MDS ANALYTICAL TECHNOLOGIES

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
B01D SEPARATION 3131
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 3444
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 3125
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8306758 Systems and methods for maintaining the precision of mass measurementOct 02, 09Nov 06, 12[G01N, G01D]
8073635 Method of quantitation by mass spectrometryFeb 15, 08Dec 06, 11[G06F]
8067728 Method of improving signal-to-noise for quantitation by mass spectrometryFeb 22, 08Nov 29, 11[H01J, B01D]
7865322 Relative noiseApr 14, 08Jan 04, 11[H04B, G06F]
7638764 Systems and methods for reducing noise from mass spectraJan 31, 08Dec 29, 09[H01J]
7622712 Method for operating an ion trap mass spectrometer systemFeb 20, 08Nov 24, 09[H01J, B01D]
7587285 Method for identifying correlated variablesAug 31, 07Sep 08, 09[G06F]
7548818 Automated analysis of complex matrices using mass spectrometerDec 06, 06Jun 16, 09[B01D]
7541579 Linear quadrupoles with added hexapole fields and method of building and operating sameFeb 07, 07Jun 02, 09[H01J]
7391015 System and method for data collection in recursive mass analysisJun 02, 06Jun 24, 08[B01D]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2010/0176,291 MASS SPECTROMETERAbandonedJan 08, 10Jul 15, 10[H01J]
2009/0194,685 HIGH-THROUGHPUT SCREENING OF METABOLIC DISORDERS USING A LASER DESORPTION ION SOURCE COUPLED TO A MASS ANALYZERAbandonedJan 30, 09Aug 06, 09[H01J, B01D]
7459918 Impedance measurement system with incorporated internal measurement drift compensation networksExpiredSep 09, 05Dec 02, 08[C12M]
5112134 Single source multi-site photometric measurement systemExpiredJan 08, 91May 12, 92[G01N]

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