MACRONIX INTERNATIONAL CO., LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology MATTERS Rank in Class
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1557 29
 
 
G11C STATIC STORES 1018 10
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 145 301
 
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 54 59
 
 
H03K PULSE TECHNIQUE 54 85
 
 
G05F SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES 36 62
 
 
H02H EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS 25 59
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 24 137
 
 
H03M CODING, DECODING OR CODE CONVERSION, IN GENERAL 17 94
 
 
C23C COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL 11 92
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Top Patents (by citation)

Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0019,254 THREE-DIMENSIONAL NON-VOLATILE MEMORY AND MANUFACTURING METHOD THEREOF Oct 14, 16 Jan 18, 18 [H01L]
2018/0012,938 3D PHASE CHANGE MEMORY WITH HIGH ENDURANCE Sep 13, 17 Jan 11, 18 [H01L]
2018/0005,699 CIRCUIT AND METHOD FOR ADJUSTING SELECT GATE VOLTAGE OF NON-VOLATILE MEMORY DURING ERASURE OF MEMORY CELLS BASED ON A WELL VOLTAGE Sep 14, 17 Jan 04, 18 [G11C]
2017/0358,357 MEMORY DEVICE AND OPERATING METHOD THEREOF Dec 27, 16 Dec 14, 17 [G11C]
2017/0351,636 MEMORY AND METHOD FOR OPERATING A MEMORY WITH INTERRUPTIBLE COMMAND SEQUENCE Jan 20, 17 Dec 07, 17 [G06F]
2017/0352,679 THREE-DIMENSIONAL SEMICONDUCTOR DEVICE Oct 11, 16 Dec 07, 17 [H01L]
2017/0344,300 MEMORY SYSTEM AND MEMORY MANAGEMENT METHOD THEREOF Dec 06, 16 Nov 30, 17 [G06F]
2017/0345,870 RESISTIVE MEMORY METHOD FOR FABRICATING THE SAME AND APPLICATIONS THEREOF Oct 12, 16 Nov 30, 17 [H01L]
2017/0322,735 MEMORY DEVICE INCLUDING RISKY MAPPING TABLE AND CONTROLLING METHOD THEREOF May 03, 16 Nov 09, 17 [G06F]
2017/0323,896 MEMORY STRUCTURE AND MANUFACTURING METHOD FOR THE SAME Oct 11, 16 Nov 09, 17 [H01L]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9881654 Power source for memory circuitry Oct 07, 15 Jan 30, 18 [G11C]
9881677 Sense amplifier and method for bit line voltage compensation thereof Apr 26, 17 Jan 30, 18 [G11C]
9881809 Semiconductor device and method of fabricating the same Apr 08, 15 Jan 30, 18 [H01L]
9882126 Phase change storage device with multiple serially connected storage regions Apr 09, 16 Jan 30, 18 [G11C, H01L]
9875811 Method and device for reading a memory Jan 13, 16 Jan 23, 18 [G11C]
9876023 Semiconductor structure and method of manufacturing the same Dec 28, 15 Jan 23, 18 [H01L]
9876055 Three-dimensional semiconductor device and method for forming the same Dec 02, 16 Jan 23, 18 [H01L]
9876493 Decode switch and method for controlling decode switch Apr 22, 15 Jan 23, 18 [G11C, H03K]
9876502 Clock integrated circuit Feb 18, 16 Jan 23, 18 [G06F, G05F, H03K, H03L]
9869712 Method and system for detecting defects of wafer by wafer sort Apr 23, 15 Jan 16, 18 [G01R, G06F]
9870835 Memory repairing method and memory device applying the same Mar 04, 15 Jan 16, 18 [G11C, G06F]
9870943 Contact process and contact structure for semiconductor device Jan 16, 15 Jan 16, 18 [H01L]
9871198 Method for manufacturing a resistive random access memory device Aug 13, 15 Jan 16, 18 [H01L]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0263,863 PHASE CHANGE MEMORY HAVING A COMPOSITE MEMORY ELEMENT ABAN Mar 14, 16 Sep 14, 17 [H01L]
2017/0207,777 INTEGRATED CIRCUIT DEVICE AND DELAY CIRCUIT DEVICE HAVING VARIED DELAY TIME STRUCTURE ABAN Jan 15, 16 Jul 20, 17 [H03K]
2017/0098,478 METHOD AND APPARATUS FOR IMPROVING YIELD FOR NON-VOLATILE MEMORY ABAN Oct 02, 15 Apr 06, 17 [G11C]
2017/0069,762 MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME ABAN Sep 04, 15 Mar 09, 17 [H01L]
2017/0025,179 NON-VOLATILE MEMORY DEVICE FOR REDUCING BIT LINE RECOVERY TIME ABAN Jul 24, 15 Jan 26, 17 [G11C]
2017/0010,605 Method and System for Providing an Improved Wafer Transport System ABAN Jul 10, 15 Jan 12, 17 [G05B, H01L]
2016/0365,407 Capacitor With 3D NAND Memory ABAN Jun 15, 15 Dec 15, 16 [H01L]
2016/0358,932 GATE-ALL-AROUND VERTICAL GATE MEMORY STRUCTURES AND SEMICONDUCTOR DEVICES, AND METHODS OF FABRICATING GATE-ALL-AROUND VERTICAL GATE MEMORY STRUCTURES AND SEMICONDUCTOR DEVICES THEREOF ABAN Jun 03, 15 Dec 08, 16 [H01L]
2016/0351,456 TEST PATTERN STRUCTURE FOR MONITORING SEMICONDUCTOR FABRICATION PROCESS ABAN May 27, 15 Dec 01, 16 [H01L]
2016/0351,493 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR THE SAME ABAN May 27, 15 Dec 01, 16 [H01L]
2016/0336,339 DEVICE AND METHOD FOR DETERMINING ELECTRICAL CHARACTERISTICS FOR ELLIPSE GATE-ALL-AROUND FLASH MEMORY ABAN Oct 13, 15 Nov 17, 16 [G11C, H01L]
2016/0307,636 METHOD AND APPARATUS FOR IMPROVING DATA RETENTION AND READ-PERFORMANCE OF A NON-VOLATILE MEMORY DEVICE ABAN Apr 17, 15 Oct 20, 16 [G11C]
2016/0307,836 SEMICONDUCTOR MEMORY DEVICE BIT LINE TRANSISTOR WITH DISCRETE GATE ABAN Apr 15, 15 Oct 20, 16 [H01L]
2016/0292,845 DETERMINING CONTACT EDGE ROUGHNESS OF A CONTACT HOLE ETCHED IN A WAFER ABAN Mar 31, 15 Oct 06, 16 [G06T]
2016/0241,021 ELECTROSTATIC DISCHARGE PROTECTION DEVICE ABAN Feb 17, 15 Aug 18, 16 [H02H]
2016/0225,445 WRITING METHOD AND READING METHOD OF PHASE CHANGE MEMORY ABAN Jan 30, 15 Aug 04, 16 [G11C]
2016/0204,123 Method of fabricating three-dimensional semiconductor devices, and three-dimensional semiconductor devices thereof ABAN Jan 13, 15 Jul 14, 16 [H01L]
2016/0204,695 CHARGE PUMP CIRCUIT AND METHOD OF CONTROLLING SAME ABAN Jun 12, 15 Jul 14, 16 [H02M]
2016/0189,999 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME ABAN Dec 24, 14 Jun 30, 16 [H01L]
2016/0190,334 MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME ABAN Dec 24, 14 Jun 30, 16 [H01L]

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