MACRONIX INTERNATIONAL CO., LTD.
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- 15 2,854 US PATENTS IN FORCE
- 76 US APPLICATIONS PENDING
- Jan 30, 2018 most recent publication
Details
- 2,854 Issued Patents
- 610 Issued in last 3 years
- 74 Published in last 3 years
- 40,810 Total Citation Count
- Oct 13, 1989 Earliest Filing
- 512 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
MATTERS
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Intl Class
Technology
MATTERS
Rank in Class
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Top Patents (by citation)
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Patent #
Title
Filing Date
Issue Date
Intl Class
CITATIONS
6177317
Method of making nonvolatile memory devices having reduced resistance diffusion regions
Apr 14, 99
Jan 23, 01
[H01L]
225
6271090
Method for manufacturing flash memory device with dual floating gates and two bits per cell
Dec 22, 00
Aug 07, 01
[H01L]
220
7220983
Self-aligned small contact phase-change memory method and device
Dec 09, 04
May 22, 07
[H01L]
202
5956473
Method and system for managing a flash memory mass storage system
Nov 25, 96
Sep 21, 99
[G11C]
200
- No Patents to Display
Recent Publications
Publication #
Title
Filing Date
Pub Date
Intl Class
2018/0019,254
THREE-DIMENSIONAL NON-VOLATILE MEMORY AND MANUFACTURING METHOD THEREOF
Oct 14, 16
Jan 18, 18
[H01L]
2018/0005,699
CIRCUIT AND METHOD FOR ADJUSTING SELECT GATE VOLTAGE OF NON-VOLATILE MEMORY DURING ERASURE OF MEMORY CELLS BASED ON A WELL VOLTAGE
Sep 14, 17
Jan 04, 18
[G11C]
2017/0351,636
MEMORY AND METHOD FOR OPERATING A MEMORY WITH INTERRUPTIBLE COMMAND SEQUENCE
Jan 20, 17
Dec 07, 17
[G06F]
2017/0345,870
RESISTIVE MEMORY METHOD FOR FABRICATING THE SAME AND APPLICATIONS THEREOF
Oct 12, 16
Nov 30, 17
[H01L]
2017/0322,735
MEMORY DEVICE INCLUDING RISKY MAPPING TABLE AND CONTROLLING METHOD THEREOF
May 03, 16
Nov 09, 17
[G06F]
- No Publications to Display
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
9881677
Sense amplifier and method for bit line voltage compensation thereof
Apr 26, 17
Jan 30, 18
[G11C]
9882126
Phase change storage device with multiple serially connected storage regions
Apr 09, 16
Jan 30, 18
[G11C, H01L]
9876055
Three-dimensional semiconductor device and method for forming the same
Dec 02, 16
Jan 23, 18
[H01L]
9869712
Method and system for detecting defects of wafer by wafer sort
Apr 23, 15
Jan 16, 18
[G01R, G06F]
9870835
Memory repairing method and memory device applying the same
Mar 04, 15
Jan 16, 18
[G11C, G06F]
9871198
Method for manufacturing a resistive random access memory device
Aug 13, 15
Jan 16, 18
[H01L]
- No Patents to Display
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2017/0263,863
PHASE CHANGE MEMORY HAVING A COMPOSITE MEMORY ELEMENT
ABAN
Mar 14, 16
Sep 14, 17
[H01L]
2017/0207,777
INTEGRATED CIRCUIT DEVICE AND DELAY CIRCUIT DEVICE HAVING VARIED DELAY TIME STRUCTURE
ABAN
Jan 15, 16
Jul 20, 17
[H03K]
2017/0098,478
METHOD AND APPARATUS FOR IMPROVING YIELD FOR NON-VOLATILE MEMORY
ABAN
Oct 02, 15
Apr 06, 17
[G11C]
2017/0025,179
NON-VOLATILE MEMORY DEVICE FOR REDUCING BIT LINE RECOVERY TIME
ABAN
Jul 24, 15
Jan 26, 17
[G11C]
2017/0010,605
Method and System for Providing an Improved Wafer Transport System
ABAN
Jul 10, 15
Jan 12, 17
[G05B, H01L]
2016/0358,932
GATE-ALL-AROUND VERTICAL GATE MEMORY STRUCTURES AND SEMICONDUCTOR DEVICES, AND METHODS OF FABRICATING GATE-ALL-AROUND VERTICAL GATE MEMORY STRUCTURES AND SEMICONDUCTOR DEVICES THEREOF
ABAN
Jun 03, 15
Dec 08, 16
[H01L]
2016/0351,456
TEST PATTERN STRUCTURE FOR MONITORING SEMICONDUCTOR FABRICATION PROCESS
ABAN
May 27, 15
Dec 01, 16
[H01L]
2016/0351,493
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR THE SAME
ABAN
May 27, 15
Dec 01, 16
[H01L]
2016/0336,339
DEVICE AND METHOD FOR DETERMINING ELECTRICAL CHARACTERISTICS FOR ELLIPSE GATE-ALL-AROUND FLASH MEMORY
ABAN
Oct 13, 15
Nov 17, 16
[G11C, H01L]
2016/0307,636
METHOD AND APPARATUS FOR IMPROVING DATA RETENTION AND READ-PERFORMANCE OF A NON-VOLATILE MEMORY DEVICE
ABAN
Apr 17, 15
Oct 20, 16
[G11C]
2016/0307,836
SEMICONDUCTOR MEMORY DEVICE BIT LINE TRANSISTOR WITH DISCRETE GATE
ABAN
Apr 15, 15
Oct 20, 16
[H01L]
2016/0292,845
DETERMINING CONTACT EDGE ROUGHNESS OF A CONTACT HOLE ETCHED IN A WAFER
ABAN
Mar 31, 15
Oct 06, 16
[G06T]
2016/0225,445
WRITING METHOD AND READING METHOD OF PHASE CHANGE MEMORY
ABAN
Jan 30, 15
Aug 04, 16
[G11C]
2016/0204,123
Method of fabricating three-dimensional semiconductor devices, and three-dimensional semiconductor devices thereof
ABAN
Jan 13, 15
Jul 14, 16
[H01L]
2016/0189,999
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
ABAN
Dec 24, 14
Jun 30, 16
[H01L]
- No Patents to Display
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