Leibniz - Institut fuer Analytische Wissenschaften- ISAS - e.V.

Patent Owner

Watch Compare Add to Portfolio

Stats

Details

Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 771
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 5201
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 2126
 
  
 
C07K PEPTIDES 1135
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 1204

Top Patents (by citation)

Upgrade to the Professional Level to View Top Patents for this Owner. Learn More

Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2016/0195,537 BIOMARKERS FOR CHOLANGIOCELLULAR CARCINOMA (CCC)Sep 08, 14Jul 07, 16[G01N]
2015/0147,761 SPECIFIC BIOMARKERS FOR HEPATOCELLULAR CARCINOMA (HCC)Jun 20, 13May 28, 15[H01J, G01N, C07K]
2015/0077,838 Fresnel RhombAug 01, 14Mar 19, 15[G02B]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9874578 Apparatus for taking a sample and for passing the sample to an analytical evaluation systemJul 23, 15Jan 23, 18[G01N]
9778248 Method for measurement of thrombocyte functionAug 26, 15Oct 03, 17[G01N]
8681329 Echelle spectrometer arrangement using internal predispersionJan 25, 10Mar 25, 14[G01J]
8587786 Method for high-resolution detection of nanoparticles on two-dimensional detector surfacesAug 26, 11Nov 19, 13[G01N]
8102527 Spectrometer assemblyMay 09, 08Jan 24, 12[G01J]
7973279 Method and device for generating positively and/or negatively ionized gas analytes for gas analysisSep 14, 07Jul 05, 11[H01J, B01D]
7876435 Method for determining background and correction of broadband backgroundJan 14, 08Jan 25, 11[G01J]
7804593 Echelle spectometer with improved use of the detector by means of two spectrometer arrangementsJun 02, 05Sep 28, 10[G01J]
7319519 Method for the analysis of echelle spectraNov 03, 01Jan 15, 08[G01J]
7215422 Assembly and method for wavelength calibration in an echelle spectrometerJan 28, 03May 08, 07[G01J]

View all patents..

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2014/0001,352 METHOD FOR THE DIELECTRIC BARRIER ELECTROSPRAY IONIZATION OF LIQUID SAMPLES AND FOR THE SUBSEQUENT MASS SPECTROMETRIC ANALYSIS OF THE GENERATED SAMPLE IONSAbandonedMar 26, 12Jan 02, 14[H01J]
2012/0065,102 METHOD FOR ANALYSIS OF NEURITE GROWTHAbandonedNov 17, 11Mar 15, 12[C40B]

Top Inventors for This Owner

Upgrade to the Professional Level to View Top Inventors for this Owner. Learn More

We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.