LOGICVISION, INC.

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2010/0037,109 METHOD FOR AT-SPEED TESTING OF MEMORY INTERFACE USING SCANAbandonedOct 15, 09Feb 11, 10[G06F, G11C]
2005/0273,683 Insertion of embedded test in RTL to GDSII flowAbandonedJun 06, 05Dec 08, 05[G06F, G01R]
2005/0240,848 Masking circuit and method of masking corrupted bitsAbandonedApr 20, 05Oct 27, 05[G01R]
2005/0229,053 Circuit and method for low frequency testing of high frequency signal waveformsAbandonedJul 21, 04Oct 13, 05[H04L, H03K, H04B, H03D, G01R]
6945665 Ceiling lamp junction box/lamp rod folding installation structureExpiredOct 23, 03Sep 20, 05[F21S]
2005/0028,059 Processor interface for test access portAbandonedJul 16, 04Feb 03, 05[G01R]
2005/0010,546 System and method for determining product specification limitsAbandonedJul 07, 03Jan 13, 05[G06F]
2004/0119,455 Method for testing parameters of high speed data signalsAbandonedDec 01, 03Jun 24, 04[H03D, G01R]
2003/0149,669 Method and system for licensing intellectual property circuitsAbandonedFeb 04, 03Aug 07, 03[G06F]
2002/0131,523 Circuit and method for compensating for non-linear distortionAbandonedMar 18, 02Sep 19, 02[H04L, H04K]
2002/0002,560 Method and system for collecting diverse data types within a manufacturing environment and accessing the diverse data types through a network portalAbandonedJun 29, 01Jan 03, 02[G06F]
6000051 Method and apparatus for high-speed interconnect testingExpiredOct 10, 97Dec 07, 99[G01R]
5923676 Bist architecture for measurement of integrated circuit delaysExpiredDec 20, 96Jul 13, 99[G06F]
5812469 Method and apparatus for testing multi-port memoryExpiredDec 31, 96Sep 22, 98[G11C]

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