LEICA MICROSYSTEMS HEIDELBERG GMBH

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 16189
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 8198
 
 
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 7121
 
 
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 573
 
 
 
H01S DEVICES USING STIMULATED EMISSION290
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1446
 
 
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 1134

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7280203 Method for setting a fluorescence spectrum measurement system for microscopyAug 24, 04Oct 09, 07[G01J]
7005622 Microscope system having a scanning device with first and second partial imagesFeb 03, 04Feb 28, 06[G02B]
6975394 Method and apparatus for measuring the lifetime of an excited state in a specimenNov 14, 01Dec 13, 05[G01N]
6961124 Method for examining a specimen, and scanning microscope systemApr 26, 02Nov 01, 05[G02B]
6958470 Scanning microscope with a detector and light source for exciting an energy state in a specimen and module for a scanning microscopeFeb 06, 02Oct 25, 05[H01J]
6947861 Method for time-optimized acquisition of special spectra using a scanning microscopeMar 20, 03Sep 20, 05[G01N]
6891670 Double confocal scanning microscopeFeb 06, 02May 10, 05[G02B]
6864989 Method for illuminating an object with light from a laser light sourceAug 28, 01Mar 08, 05[G01B]
6844965 Apparatus for optical scanning of multiple specimensNov 15, 00Jan 18, 05[H01J, G02B]
6813072 Method for adjusting a microscope and microscope with a device for adjusting a light beamFeb 20, 02Nov 02, 04[G02B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
6934022 Method for differentiated investigation of diverse structures in preferably biological preparationsExpiredDec 10, 99Aug 23, 05[G01N]
2005/0141,081 Method for correcting drift in an optical deviceAbandonedDec 08, 04Jun 30, 05[G21K, G01N, G02B]
2005/0078,361 Microscope having a reference specimenAbandonedAug 17, 04Apr 14, 05[G02B]
2005/0024,637 Detector and method for detecting weak fluorescent radiation with a microscope systemAbandonedJul 20, 04Feb 03, 05[G01N]
2004/0230,808 EDP system and a method for utilizing the EDP systemAbandonedMay 06, 04Nov 18, 04[H04K]
2004/0036,872 Apparatus for spectral selection and detection of a light beam, and scanning microscopeAbandonedAug 20, 03Feb 26, 04[G01J]
2004/0032,651 Method for scanning microscopy, and scanning microscopeAbandonedJul 11, 03Feb 19, 04[G02B]
6678089 MicroscopeExpiredApr 13, 00Jan 13, 04[G02B]
2003/0214,707 Scanning microscope and beam deflection deviceAbandonedMay 16, 03Nov 20, 03[G02B]
2003/0184,857 Microscope having apparatus for determining the light power level of an illuminating light beamAbandonedMar 27, 03Oct 02, 03[G02B]
2003/0184,882 Variable diaphragm, and confocal scanning microscopeAbandonedMar 27, 03Oct 02, 03[G02B]
6545765 Method and apparatus for measuring thickness of transparent filmsExpiredNov 08, 00Apr 08, 03[G01B]
2003/0021,017 Arrangement for micromanipulation of biological specimensAbandonedJul 25, 02Jan 30, 03[G02B]
2002/0163,715 Microscope, and method for operating a microscopeAbandonedApr 30, 02Nov 07, 02[G01N, G02B, G01V]
2002/0159,144 Scanning microscope and coupling-out elementAbandonedApr 23, 02Oct 31, 02[G02B]
2002/0159,145 Microscope with an illumination for a control elementAbandonedApr 26, 02Oct 31, 02[G02B]
2002/0097,488 Safety apparatus for microscopes having a laser beam as illumination sourceAbandonedJan 11, 02Jul 25, 02[G02B]
2002/0085,763 Method, arrangement, and system for ascertaining process variablesAbandonedDec 17, 01Jul 04, 02[G06K]
2002/0054,429 Arrangement for visual and quantitative three-dimensional examination of specimens and stereomicroscope thereforAbandonedNov 06, 01May 09, 02[G02B]
2002/0043,622 Arrangement for studying microscopic preparations with a scanning microscopeAbandonedJun 15, 01Apr 18, 02[G01N]

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