KRATOS ANALYTICAL LIMITED

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 22106
 
  
 
B01D SEPARATION 2132
 
  
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 256
 
  
 
C12Q MEASURING OR TESTING PROCESSES INVOLVING ENZYMES OR MICRO-ORGANISMS 1124
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1446
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 145
 
  
 
H03M CODING, DECODING OR CODE CONVERSION, IN GENERAL 1110
 
  
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 1284

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2016/0349,277 OXIDIZED LIPID DETECTIONFeb 09, 15Dec 01, 16[G01N]
2016/0237,469 MICROBIAL ANALYSISOct 09, 14Aug 18, 16[H01J, C12Q]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9508540 Method and apparatus useful for imagingJun 02, 08Nov 29, 16[H01J]
9468953 Methods and apparatuses for cleaning at least one surface of an ion sourceJul 28, 11Oct 18, 16[H01J, B08B]
8969796 Timing device and methodMar 12, 14Mar 03, 15[H01J, H04L, H03K, H03M, G06F]
8791408 Methods and apparatuses for producing mass spectrum dataJul 28, 11Jul 29, 14[H01J]
8716674 Timing device and methodNov 03, 11May 06, 14[H01J]
8481931 Electron spectroscopyJun 11, 09Jul 09, 13[H01J, G21K]
8373122 Spheroidal charged particle energy analysersMar 31, 08Feb 12, 13[H01J]
8212209 TOF mass spectrometer for stigmatic imaging and associated methodJul 16, 09Jul 03, 12[H01J, B01D]
8198582 Method and apparatus for thermalization of ionsJun 14, 07Jun 12, 12[H01J, B01D]
7910878 Method and apparatus for ion axial spatial distribution focusingJul 21, 09Mar 22, 11[H01J]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2009/0129,551 Electrode for X-ray apparatusAbandonedOct 09, 08May 21, 09[H05G]
7071463 Calibration methodExpiredMar 17, 03Jul 04, 06[H01J]
6717134 Calibration methodExpiredSep 06, 01Apr 06, 04[H01J]
5321262 Electron imaging band pass analyser for a photoelectron spectromicroscopeExpiredSep 30, 92Jun 14, 94[H01J]
5166519 Electron imaging band pass analyser for a photoelectron spectromicroscopeExpiredMar 11, 91Nov 24, 92[H01J]
5164593 Mass spectrometer system including an ion source operable under high pressure conditions, and a two-stage pumping arrangementExpiredFeb 28, 91Nov 17, 92[H01J]
5160841 Ion source for a mass spectrometerExpiredDec 12, 91Nov 03, 92[H01J]
5077472 Ion mirror for a time-of-flight mass spectrometerExpiredJul 10, 90Dec 31, 91[H01J]
4908512 Apparatus and methods of use in the mass analysis of chemical samplesExpiredAug 21, 85Mar 13, 90[H01J]
4823003 Charged particle optical systems having therein means for correcting aberrationsExpiredJul 13, 87Apr 18, 89[H01J]
4820648 Methods for use in the mass analysis of chemical samplesExpiredAug 21, 85Apr 11, 89[G01N]
4810879 Charged particle energy analyzerExpiredApr 10, 87Mar 07, 89[H01J]
4358680 Charged particle spectrometersExpiredNov 26, 80Nov 09, 82[H01J]

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