KABUSHIKI KAISHA NIHON MICRONICS

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 8980
 
  
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 27106
 
  
 
H01M PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY 13141
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 12144
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 11351
 
  
 
1303 EQUIPMENT FOR DISTRIBUTION OR CONTROL OF ELECTRIC POWER764
 
  
 
B23K SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM 291
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS297
 
  
 
H01K ELECTRIC INCANDESCENT LAMPS 220
 
  
 
H02J CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY 2118

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0131,361 TESTING DEVICE AND TESTING METHOD FOR SHEET-SHAPED CELLJul 31, 14May 11, 17[H01M, G01R]
2017/0098,870 BATTERYJan 09, 15Apr 06, 17[H01M, H01G]
2016/0276,711 SECONDARY BATTERY AND METHOD OF MANUFACTURING THE SAMEDec 10, 13Sep 22, 16[H02J, H01M]
2016/0146,885 PROBE AND CONTACT INSPECTION DEVICENov 19, 15May 26, 16[G01R]
2016/0043,375 STACKED-TYPE SECONDARY BATTERYApr 03, 14Feb 11, 16[H01M]
2015/0155,608 ELECTRODE STRUCTURE OF SOLID TYPE SECONDARY BATTERYJun 06, 12Jun 04, 15[H02J, H01L, H01M]
2014/0352,775 REPEATEDLY CHARGEABLE AND DISCHARGEABLE QUANTUM BATTERYOct 30, 11Dec 04, 14[H02J, H01L]
2014/0118,018 INSPECTION UNIT, PROBE CARD, INSPECTION DEVICE, AND CONTROL SYSTEM FOR INSPECTION DEVICEOct 29, 13May 01, 14[G01R]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9917330 Secondary batteryDec 10, 13Mar 13, 18[H02J, H01L, H01M]
9910089 Inspection unit, probe card, inspection device, and control system for inspection deviceOct 29, 13Mar 06, 18[G01R]
9865859 Stacked-type secondary batteryApr 03, 14Jan 09, 18[H01M]
9865908 Electrode structure of solid type secondary batteryJun 06, 12Jan 09, 18[H02J, H01L, H01M]
9859596 Repeatedly chargeable and dischargeable quantum batteryOct 30, 11Jan 02, 18[H02J, H01L, H01M]
9799927 Repair apparatus of sheet type cellNov 14, 11Oct 24, 17[H01L, H01M]
9778284 Semiconductor probe, testing device and testing method for testing quantum batteryMay 31, 12Oct 03, 17[H01L, G01R]
9767721 Inspection apparatus and inspection methodNov 13, 14Sep 19, 17[G09G, G01R]
9759744 Contact inspection deviceJul 08, 13Sep 12, 17[G01R]
9748596 Single layer secondary battery having a folded structureApr 25, 13Aug 29, 17[H01M]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2013/0187,676 INSPECTION APPARATUSAbandonedJul 27, 12Jul 25, 13[G01R]
2011/0175,635 PROBE FOR ELECTRICAL TEST AND METHOD FOR MANUFACTURING THE SAME, AND ELECTRICAL CONNECTING APPARATUS AND METHOD FOR MANUFACTURING THE SAMEAbandonedJan 04, 11Jul 21, 11[H01R, G01R]
2010/0022,104 ELECTRICAL CONNECTING APPARATUSAbandonedSep 18, 07Jan 28, 10[H01R]
2009/0015,276 PROBE ASSEMBLY AND METHOD FOR PRODUCING ITAbandonedJun 26, 08Jan 15, 09[B23K, G01R]
2009/0009,197 PROBE FOR ELECTRICAL TESTAbandonedJul 02, 07Jan 08, 09[G01R]
2008/0297,184 SEMICONDUCTOR TEST APPARATUSAbandonedApr 18, 08Dec 04, 08[G01R]
2008/0280,542 CLEANING APPARATUS FOR A PROBEAbandonedMay 05, 08Nov 13, 08[B24B]
2008/0272,796 PROBE ASSEMBLYAbandonedApr 11, 08Nov 06, 08[G01R]
2008/0197,869 ELECTRICAL CONNECTING APPARATUSAbandonedFeb 04, 08Aug 21, 08[G01R]
2008/0191,727 PROBE AND PROBE ASSEMBLYAbandonedJan 21, 08Aug 14, 08[G01R]
2007/0159,194 Probing apparatusAbandonedJan 09, 07Jul 12, 07[G01R]
2007/0069,748 Probe assemblyAbandonedOct 23, 06Mar 29, 07[G01R]
2007/0018,633 Probe use in electric testAbandonedMay 19, 06Jan 25, 07[G01R]
2007/0007,948 Electrical connection deviceAbandonedJun 26, 06Jan 11, 07[G01R]
6672877 Contactor block and apparatus for electrical connectionExpiredDec 16, 02Jan 06, 04[H01R]
6271674 Probe cardExpiredJul 27, 99Aug 07, 01[G01R]
5982184 Test head for integrated circuitsExpiredSep 02, 97Nov 09, 99[G01R]

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