JEOL LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 20026
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 60146
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 3315
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 24135
 
  
 
B01D SEPARATION 9125
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS792
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 7440
 
  
 
G01T MEASUREMENT OF NUCLEAR OR X-RADIATION 547
 
  
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 454
 
  
 
B65G TRANSPORT OR STORAGE DEVICES, e.g. CONVEYERS FOR LOADING OR TIPPING; SHOP CONVEYER SYSTEMS; PNEUMATIC TUBE CONVEYERS 463

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0031,591 Automatic Analyzer and ProgramJul 24, 17Feb 01, 18[G01N, G01F]
2017/0336,485 Magnetic Resonance Signal Detection ModuleMay 11, 17Nov 23, 17[G01R]
2017/0307,534 Luminescence Measuring Device and Automatic Analysis DeviceOct 01, 15Oct 26, 17[G01N]
2017/0133,196 Charged Particle System and Measuring MethodSep 07, 16May 11, 17[H01J]
2017/0025,248 Electron Microscope and Measurement MethodMay 11, 16Jan 26, 17[H01J]
2016/0341,692 Electrolyte Measuring Apparatus and Electrolyte Measuring MethodMay 20, 16Nov 24, 16[G01N]
2016/0259,529 Image Display Device, Image Display Method, and Information Storage MediumMar 02, 16Sep 08, 16[G06F]
2016/0169,925 Measurement-Container Supply DeviceJun 20, 14Jun 16, 16[G01N]
2016/0041,064 Aberration Computing Device, Aberration Computing Method, Image Processor, Image Processing Method, and Electron MicroscopeMay 07, 15Feb 11, 16[H01J, G01M]
2016/0020,066 Device and Method for Computing Angular Range for Measurement of Aberrations and Electron MicroscopeJun 18, 15Jan 21, 16[H01J]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9916963 Specimen loading method, specimen stage, and charged particle beam deviceJun 18, 15Mar 13, 18[H01J, G01N, G01F]
9892886 Charged particle beam system and method of aberration correctionJun 08, 17Feb 13, 18[H01J]
9881768 Charged Particle Beam System With Receptacle Chamber For Cleaning Sample and Sample StageAug 10, 16Jan 30, 18[H01J, G01L]
9874532 Scatter diagram display device and surface analyzerOct 19, 15Jan 23, 18[G06T, G01N]
9859095 Electron microscope and measurement methodMay 11, 16Jan 02, 18[H01J]
9835639 Gripping mechanismNov 25, 15Dec 05, 17[G01N, B65G, B25J]
9824856 Deposition method and focused ion beam systemDec 02, 15Nov 21, 17[C23C, H01J]
9804184 Automated analyzer and method for lifting and lowering rod-like member in automated analyzerNov 18, 15Oct 31, 17[G01N, B01L, B01F]
9804186 Liquid suction tool, liquid supply unit and automated analyzerNov 11, 15Oct 31, 17[G01N, B01L]
9793088 Two-stage dodecapole aberration corrector for charged-particle beamSep 22, 09Oct 17, 17[H01J]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2016/0163,501 Charged Particle Beam Device and Image Acquisition MethodAbandonedDec 03, 15Jun 09, 16[H01J]
2016/0013,012 Charged Particle Beam SystemAbandonedMar 25, 15Jan 14, 16[H01J]
2015/0314,389 Machine and Method for Additive ManufacturingAbandonedMar 25, 15Nov 05, 15[B23K]
2015/0306,666 Additive Manufacturing MachineAbandonedMar 20, 15Oct 29, 15[B22F]
2015/0311,028 Apparatus and Method for Sample PreparationAbandonedFeb 25, 15Oct 29, 15[H01J]
2015/0273,622 Machine and Method for Additive ManufacturingAbandonedMar 25, 15Oct 01, 15[B23K]
2015/0168,321 Surface Analysis InstrumentAbandonedNov 24, 14Jun 18, 15[G01N]
2015/0168,435 Automated AnalyzerAbandonedDec 10, 14Jun 18, 15[G01N]
2014/0341,469 Image Processing Method, Image Processor, Imager, and Computer ProgramAbandonedMay 13, 14Nov 20, 14[G06T]
2014/0209,193 Charged Particle Beam InstrumentAbandonedJan 29, 14Jul 31, 14[H01J]
2014/0112,830 Automated AnalyzerAbandonedOct 22, 13Apr 24, 14[G01N]
2013/0289,892 Time-of-Flight Mass Spectrometer and Data Compression Method ThereforAbandonedMar 11, 13Oct 31, 13[H01J, H03M]
8541755 Electron microscopeExpiredMay 09, 12Sep 24, 13[H01J]
8466416 Electron detecting mechanism and charged particle beam system equipped therewithExpiredMar 20, 12Jun 18, 13[H01J]
2013/0022,929 METHOD AND SYSTEM FOR MANUFACTURING A SURFACE USING SHAPED CHARGED PARTICLE BEAM LITHOGRAPHYAbandonedSep 29, 12Jan 24, 13[G21K, G03F]
2012/0318,302 Instrument and Method for Clinical Examinations and Cleaning Method ThereforAbandonedJun 13, 12Dec 20, 12[B08B, G01N]
2012/0085,905 Tandem Time-of-Flight Mass SpectrometerAbandonedOct 03, 11Apr 12, 12[H01J]
2012/0061,593 Charged-Particle Beam Lithographic Apparatus and Lithographic Method ThereforAbandonedSep 12, 11Mar 15, 12[G21K]
2011/0284,745 Sample Holder, Inspection Apparatus, and Inspection MethodAbandonedMay 03, 11Nov 24, 11[G21K, G01N]
2011/0220,786 Tandem Time-of-Flight Mass SpectrometerAbandonedFeb 14, 11Sep 15, 11[H01J]

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