INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW (IMEC)

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 26336
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 7440
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 3203
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 3101
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS297
 
  
 
G03B APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR 295
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 2196
 
  
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 157
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
  
 
G01V GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS 179

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2009/0301,557 METHOD FOR PRODUCING PHOTOVOLTAIC CELLS AND PHOTOVOLTAIC CELLS OBTAINED BY SUCH METHODSep 14, 07Dec 10, 09[H01L]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9086638 Detection of contamination in EUV systemsOct 26, 11Jul 21, 15[G03B, G03F]
8634496 Method for determining and compensating transceiver non-idealitiesOct 31, 08Jan 21, 14[H03K]
8623668 Method for transport of magnetic particles and devices thereforNov 07, 05Jan 07, 14[G01N]
8560795 Memory arrangement for multi-processor systems including a memory queueDec 28, 07Oct 15, 13[G06F]
8532339 System and method for motion detection and the use thereof in video codingAug 08, 11Sep 10, 13[G06K]
8319295 Use of F-based gate etch to passivate the high-k/metal gate stack for deep submicron transistor technologiesJan 09, 08Nov 27, 12[H01L]
8313993 Semiconductor device and method for fabricating the sameJan 22, 09Nov 20, 12[H01L]
8286112 Methods for characterization of electronic circuits under process variability effectsJun 23, 08Oct 09, 12[G06F]
8261042 Reconfigurable multi-processing coarse-grain arraySep 12, 08Sep 04, 12[G06F]
8261252 Method and system for automated code conversionMar 26, 08Sep 04, 12[G06F]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
8211812 Method for fabricating a high-K dielectric layerExpiredApr 16, 08Jul 03, 12[H01L]
8207473 Method for manufacturing a stretchable electronic deviceExpiredJun 24, 08Jun 26, 12[B23K, H05K]
7964039 Cleaning of plasma chamber walls using noble gas cleaning stepExpiredSep 05, 08Jun 21, 11[B08B]
2010/0002,236 METHOD FOR DETERMINING THE DOPING PROFILE OF A PARTIALLY ACTIVATED DOPED SEMICONDUCTOR REGIONAbandonedJun 25, 09Jan 07, 10[G01N]
2009/0223,832 Method and Apparatus for Preventing Galvanic Corrosion in Semiconductor ProcessingAbandonedJan 07, 09Sep 10, 09[C25F]
2009/0228,874 METHOD AND SYSTEM FOR CODE COMPILATIONAbandonedMar 06, 09Sep 10, 09[G06F]
7582547 Method for junction formation in a semiconductor device and the semiconductor device made thereofExpiredAug 03, 07Sep 01, 09[H01L]
2009/0215,275 Defect Etching of GermaniumAbandonedJan 29, 09Aug 27, 09[C09K, H01L]
2009/0217,224 METHOD AND SYSTEM FOR MASK DESIGN FOR DOUBLE PATTERNINGAbandonedFeb 20, 09Aug 27, 09[G06F]
2009/0206,417 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAMEAbandonedFeb 19, 09Aug 20, 09[H01L]
2009/0174,003 DUAL WORK FUNCTION DEVICE WITH STRESSOR LAYER AND METHOD FOR MANUFACTURING THE SAMEAbandonedNov 12, 08Jul 09, 09[H01L]
2009/0175,381 DIGITAL RECEIVER FOR REACTIVE RADIOAbandonedNov 14, 08Jul 09, 09[H04L]
2009/0134,466 DUAL WORK FUNCTION SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAMEAbandonedOct 24, 08May 28, 09[H01L]
2009/0134,469 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE WITH DUAL FULLY SILICIDED GATEAbandonedNov 28, 07May 28, 09[H01L]
2009/0129,281 QUALITY-ENERGY SCALABILITY TECHNIQUE FOR TRACKING SYSTEMSAbandonedNov 21, 07May 21, 09[H04L]
2009/0103,069 DETECTION OF CONTAMINATION IN EUV SYSTEMSAbandonedSep 23, 08Apr 23, 09[G03B, A61N]
7504329 Method of forming a Yb-doped Ni full silicidation low work function gate electrode for n-MOSFETExpiredMay 11, 06Mar 17, 09[H01L]
7488669 Method to make markers for double gate SOI processingExpiredMar 16, 05Feb 10, 09[H01L]
2009/0020,786 SEMICONDUCTOR DEVICEAbandonedJun 24, 08Jan 22, 09[H01L]
2009/0011,604 PHOTON INDUCED REMOVAL OF COPPERAbandonedJun 27, 08Jan 08, 09[H01L, B44C]

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