Hitachi Science Systems, Ltd.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 12116
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 9197
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 244
 
  
 
F04B POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS 161
 
  
 
F26B DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM 129
 
  
 
G01D MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 159
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 1103
 
  
 
G06Q DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES, NOT OTHERWISE PROVIDED FOR 1173
 
  
 
G09G ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION 1150

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7788108 Cross-contamination prevention system and automatic analyzer which equip for itNov 20, 03Aug 31, 10[G06Q]
7727469 Automatic analyzerApr 13, 04Jun 01, 10[G01N]
7625524 Automatic analyzerOct 02, 03Dec 01, 09[G01N, B01L]
7547414 Automatic analyzerJul 26, 04Jun 16, 09[G01N]
7521695 Scanning electron microscopeApr 11, 07Apr 21, 09[H01J]
7511271 Scanning electron microscopeSep 21, 05Mar 31, 09[H01J]
7459123 Automatic analyzerDec 16, 04Dec 02, 08[G01N]
7364698 Automatic analyzerJan 14, 04Apr 29, 08[G01N]
7217925 Scanning electron microscopeDec 22, 05May 15, 07[H01J]
7214937 Electron microscopeFeb 09, 05May 08, 07[H01J]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7995833 Method of alignment for efficient defect reviewExpiredOct 12, 07Aug 09, 11[G06K]
7294833 Method of alignment for efficient defect reviewExpiredMay 19, 04Nov 13, 07[H01J]
7274017 Electron beam apparatus and high-voltage discharge prevention methodExpiredMay 26, 05Sep 25, 07[H01J]
7179000 Method of developing a resist film and a resist development processorExpiredFeb 23, 06Feb 20, 07[G03D]
7146872 Micro manipulatorExpiredAug 08, 02Dec 12, 06[B25J]
2006/0127,799 Method for forming resist pattern and resist patternAbandonedDec 02, 03Jun 15, 06[G03C]
7033089 Method of developing a resist film and a resist development processorExpiredNov 13, 03Apr 25, 06[G03D]
6992286 Material characterization systemExpiredMar 05, 04Jan 31, 06[G01N]
6982420 Sample observation method and transmission electron microscopeExpiredNov 25, 03Jan 03, 06[G21K]
6949752 Electron beam apparatus and high-voltage discharge prevention methodExpiredNov 18, 02Sep 27, 05[G09G]
6920703 Microstructure drying treatment method and its apparatus and its high pressure vesselExpiredMay 04, 04Jul 26, 05[F26B]
2005/0112,025 Automatic analyzerAbandonedNov 23, 04May 26, 05[G01N]
6713761 Scanning electron microscopeExpiredMay 24, 01Mar 30, 04[H01J]
6657193 Scanning electron microscopeExpiredOct 21, 02Dec 02, 03[H01J]
5523567 Scanning electron microscope and image forming method therewithExpiredOct 28, 94Jun 04, 96[H01J]
5350918 Transmission electron microscopeExpiredAug 27, 92Sep 27, 94[H01J]

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