Hitachi Science Systems, Inc.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 145

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7459123 Automatic analyzerDec 16, 04Dec 02, 08[G01N]
6963067 Scanning electron microscope and sample observing method using itJan 05, 04Nov 08, 05[G21K]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2006/0011,834 Low vacuum scanning electron microscopeAbandonedJul 12, 05Jan 19, 06[G21K]

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