HITACHI KENKI FINE TECH CO., LTD.
Patent Owner
Stats
- 0 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Oct 09, 2008 most recent publication
Details
- 0 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 41 Total Citation Count
- Mar 22, 2004 Earliest Filing
- 5 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
- No Technology to Display
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Recent Publications
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Recent Patents
- No Recent Patents to Display
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2008/0245,139 SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD OF SAMEAbandonedApr 02, 08Oct 09, 08[G01B]
7388199 Probe manufacturing method, probe, and scanning probe microscopeExpiredSep 03, 04Jun 17, 08[G21K]
7350404 Scanning type probe microscope and probe moving control method thereforExpiredAug 27, 04Apr 01, 08[G21K]
2007/0180,889 Probe replacement method for scanning probe microscopeAbandonedMar 22, 04Aug 09, 07[G01N, G12B]
7243441 Method and apparatus for measuring depth of holes formed on a specimenExpiredNov 15, 04Jul 17, 07[G01B]
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