HITACHI HIGH-TECHNOLOGIES CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology MATTERS Rank in Class
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 970 2
 
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 737 1
 
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 215 56
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 203 178
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 108 335
 
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 105 4
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 90 23
 
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 72 71
 
 
B01L CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE 65 11
 
 
2401 APPARATUS AND EQUIPMENT FOR DOCTORS, HOSPITALS AND LABORATORIES 62 4
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Top Patents (by citation)

Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0030,433 Operation Method for Control Materials and Automated Analyzer Feb 23, 15 Feb 01, 18 [C12N, C12Q]
2018/0030,506 Method for Constructing Nucleic Acid Molecule Feb 26, 16 Feb 01, 18 [C12Q]
2018/0031,469 Terahertz Wave Generating Device and Spectroscopic Device Using Same Mar 03, 15 Feb 01, 18 [H01S, G02F, G01N]
2018/0031,589 AUTOMATIC ANALYSER Feb 05, 16 Feb 01, 18 [B01L, G01N]
2018/0024,061 MULTICOLOR DETECTION DEVICE Feb 03, 15 Jan 25, 18 [C12Q, G01N]
2018/0024,154 AUTOMATED ANALYSIS DEVICE, AND LID OPENING/CLOSING MECHANISM Jan 07, 16 Jan 25, 18 [G01N]
2018/0025,894 PLASMA PROCESSING APPARATUS AND ANALYSIS METHOD FOR ANALYZING PLASMA PROCESSING DATA Feb 28, 17 Jan 25, 18 [G01J, H01J]
2018/0025,896 ION GUIDE AND MASS SPECTROMETER USING SAME Feb 23, 15 Jan 25, 18 [H01J]
2018/0017,492 Multicolor Fluorescence Analysis Device Feb 02, 15 Jan 18, 18 [G01N]
2018/0017,502 EXAMINATION DEVICE Jan 26, 16 Jan 18, 18 [G01N]
2018/0017,588 Automatic Analysis Device Feb 05, 16 Jan 18, 18 [G01N]
2018/0019,096 Charged Particle Beam Device, and Method of Manufacturing Component for Charged Particle Beam Device Jan 21, 16 Jan 18, 18 [C23D, H01J]
2018/0019,097 SAMPLE OBSERVATION METHOD AND SAMPLE OBSERVATION DEVICE Dec 21, 15 Jan 18, 18 [G06T, G01B, H01J]
2018/0010,084 TEST DEVICE Jan 22, 16 Jan 11, 18 [G02B, C12M, G06T, C12Q]
2018/0011,021 MULTICOLOR FLUORESCENCE ANALYSIS DEVICE Nov 11, 15 Jan 11, 18 [G01N]
2018/0011,121 AUTOMATED ANALYZER AND LIQUID RESERVOIR Jan 07, 16 Jan 11, 18 [B01L, G01N]
2018/0012,349 Pattern Measurement Apparatus and Flaw Inspection Apparatus Jan 23, 15 Jan 11, 18 [G06T, G03F, G01B, H01J]
2018/0012,375 AUTOMATIC ANALYSER Feb 05, 16 Jan 11, 18 [G06T, G01N, G06K]
2018/0012,725 Charged Particle Beam Device Jan 28, 15 Jan 11, 18 [H01J]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9880082 Detection device that calculates a center of gravity of a container gap region Jul 02, 14 Jan 30, 18 [G01N]
9880153 Componential analyzer, drug efficacy analyzer, and analysis method Nov 26, 14 Jan 30, 18 [C12M, G01N]
9880182 Automatic analyzer Jul 08, 14 Jan 30, 18 [G01N]
9881365 Semiconductor defect categorization device and program for semiconductor defect categorization device Apr 11, 13 Jan 30, 18 [G06T, H01L, G01N, G06K]
9881769 Charged particle beam device and charged particle beam device control method Oct 07, 14 Jan 30, 18 [H01J]
9875877 Electron scanning microscope and image generation method Feb 10, 15 Jan 23, 18 [H01J, G01N]
9869686 Automatic analyzer Jan 14, 15 Jan 16, 18 [G01N]
9862921 Method for determining cell state and autoanalyzer using said method Jun 17, 14 Jan 09, 18 [C12M, G01N]
9863969 Method of evaporation control of a sample stored in a cold container Jun 19, 15 Jan 09, 18 [G01N]
9865046 Defect inspection method and defect inspection device Dec 11, 13 Jan 09, 18 [G06T, G01N, G06K]
9865439 Plasma processing apparatus Sep 11, 15 Jan 09, 18 [H01J]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0230,271 DATA MANAGEMENT APPARATUS AND MONITORING METHOD OF SAME ABAN Aug 26, 16 Aug 10, 17 [H04L]
2016/0379,797 Charged Particle Beam Apparatus ABAN Jun 25, 14 Dec 29, 16 [H01J]
2016/0195,563 AUTOMATED ANALYZER ABAN Jul 29, 14 Jul 07, 16 [G01N]
2016/0181,118 PLASMA PROCESSING METHOD ABAN Sep 11, 15 Jun 23, 16 [H01L]
2016/0168,525 Cell Culturing Method, Particulate Culture Carrier, and Particle-Encompassing Cell Aggregate ABAN May 09, 14 Jun 16, 16 [C12N, C12M]
2016/0079,055 SAMPLE CLEANING APPARATUS AND SAMPLE CLEANING METHOD ABAN Feb 19, 15 Mar 17, 16 [B08B, H01L, B06B]
2016/0079,073 PLASMA PROCESSING METHOD ABAN Feb 19, 15 Mar 17, 16 [H01L]
2015/0308,986 SAMPLE INJECTION DEVICE ABAN Oct 21, 13 Oct 29, 15 [H01J, G01N]
2015/0293,034 INSPECTION DEVICE AND INSPECTION METHOD ABAN Oct 23, 13 Oct 15, 15 [G01J, G01N]
2015/0276,557 STATE MONITORING SYSTEM, STATE MONITORING METHOD AND MEDIUM ABAN Mar 27, 15 Oct 01, 15 [G01M]
2015/0278,325 INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, INFORMATION SYSTEM AND MEDIUM ABAN Mar 27, 15 Oct 01, 15 [G06F]
2015/0270,148 ETCHING APPARATUS ABAN Feb 20, 15 Sep 24, 15 [H01J, H01L]
2015/0243,472 Electron Microscope and Sample Movement Device ABAN Jun 26, 13 Aug 27, 15 [H01J]
2015/0212,105 ANALYSIS SYSTEM AND ANALYSIS METHOD ABAN Jul 08, 13 Jul 30, 15 [G01N]
2015/0213,999 Charged Particle Beam Apparatus ABAN Jul 01, 13 Jul 30, 15 [H01J]
2015/0206,705 MEMBER FOR CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM DEVICE AND DIAPHRAGM MEMBER ABAN Jul 11, 13 Jul 23, 15 [H01J]
2015/0198,569 MASS ANALYSIS METHOD AND MASS ANALYSIS SYSTEM ABAN Jul 08, 13 Jul 16, 15 [H01J, G01N]
2015/0176,070 FLOW CELL FOR BIOMATERIAL ANALYSIS AND BIOMATERIAL ANALYSIS DEVICE ABAN Jul 11, 13 Jun 25, 15 [C12Q, G01N]
2015/0179,394 Charged Particle Device ABAN Apr 22, 13 Jun 25, 15 [H01J]
2015/0170,886 PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD ABAN Jul 31, 14 Jun 18, 15 [H01J, H01L]

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