HITACHI HIGH-TECH SCIENCE CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 16265
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 12740
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 3315
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS2871
 
  
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]282
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 22340
 
  
 
G01K MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 2026
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1167
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 9438
 
  
 
C23C COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL 893

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0067,048 Unknown Sample Determining Method, Unknown Sample Determining Instrument, and Unknown Sample Determining ProgramSep 06, 17Mar 08, 18[G01J, G01N]
2017/0276,621 RADIATION ANALYZING APPARATUS AND RADIATION ANALYZING METHODMar 22, 17Sep 28, 17[G01N]
2017/0278,664 CHARGED PARTICLE BEAM APPARATUSMar 24, 17Sep 28, 17[H01J]
2017/0269,012 X-RAY ANALYZERMar 16, 17Sep 21, 17[G01N]
2017/0271,119 COMPOSITE CHARGED PARTICLE BEAM APPARATUSMar 16, 17Sep 21, 17[H01J]
2017/0062,174 TRANSPORT DEVICE, TREATMENT DEVICE, VACUUM DEVICE, AND CHARGED PARTICLE BEAM DEVICEAug 31, 16Mar 02, 17[H01J]
2017/0062,175 SAMPLE HOLDER AND SAMPLE HOLDER SETJun 27, 16Mar 02, 17[H01J]
2016/0322,123 Repair ApparatusJun 22, 16Nov 03, 16[H01J, G21K]
2016/0291,053 Scanning Probe Microscope and Measurement Range Adjusting Method for Scanning Probe MicroscopeMar 31, 16Oct 06, 16[G01Q]
2015/0276,626 X-Ray Transmission Inspection ApparatusMar 31, 15Oct 01, 15[G01N]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9921241 Scanning probe microscope and measurement range adjusting method for scanning probe microscopeMar 31, 16Mar 20, 18[G01Q]
9897579 Method for correcting evolved gas analyzer and evolved gas analyzerNov 19, 16Feb 20, 18[H01J, G01N]
9899198 Method for analyzing evolved gas and evolved gas analyzerNov 19, 16Feb 20, 18[H01J, G01N]
9885639 Sample carrying device and vacuum apparatusJan 25, 16Feb 06, 18[H01J, G01N]
9885645 Thermal analyzerMar 13, 15Feb 06, 18[G01N]
9863896 X-ray transmission inspection apparatusMar 31, 15Jan 09, 18[G01N, G01B]
9865425 Sample holder and sample holder setJun 27, 16Jan 09, 18[H01J, G02B]
9829447 X-ray fluorescence analyzer and method of displaying sample thereofAug 24, 15Nov 28, 17[H04N, G06T, G01N]
9831077 Method for analyzing evolved gas and evolved gas analyzerNov 19, 16Nov 28, 17[H01J, G01N]
9823208 Method for measuring spreading resistance and spreading resistance microscopeMar 30, 16Nov 21, 17[G01L, G01N, G01Q, G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2016/0290,862 SEQUENTIAL ICP OPTICAL EMISSION SPECTROMETER AND METHOD FOR CORRECTING MEASUREMENT WAVELENGTHAbandonedMar 29, 16Oct 06, 16[G01J, G01N]
2016/0033,658 SEMICONDUCTOR RADIATION DETECTOR ARRAYAbandonedOct 28, 14Feb 04, 16[H01L, G01T]
2015/0268,169 ICP Optical Emission SpectrometerAbandonedMar 18, 15Sep 24, 15[G01J, G01N]
2015/0130,812 Measured Data Digitization Apparatus, Measured Data Digitization Method and Non-Transitory Computer-Readable MediumAbandonedNov 11, 14May 14, 15[G06T]
2013/0209,701 METHOD OF PREPARING SAMPLE FOR TEM OBSERVATIONAbandonedFeb 07, 13Aug 15, 13[C23C]
8062494 Micro-machining dust removing device, micro-machining apparatus, and micro-machining dust removing methodExpiredJun 04, 07Nov 22, 11[B23H]
7641384 Thermal analysis system and method of drying the sameExpiredJul 18, 07Jan 05, 10[G01K]
7634054 X-ray tube and X-ray analysis apparatusExpiredJul 18, 08Dec 15, 09[H01J, G01N]
7627088 X-ray tube and X-ray analysis apparatusExpiredJul 18, 08Dec 01, 09[H01J, G01N]
7587025 X-ray analysis apparatus and X-ray analysis methodExpiredJan 10, 08Sep 08, 09[G01N]
7323685 Ion beam processing methodExpiredFeb 16, 04Jan 29, 08[H01J]
6885727 Apparatus and method for measuring thickness and composition of multi-layered sampleExpiredAug 06, 02Apr 26, 05[G01N]
6870161 Apparatus for processing and observing a sampleExpiredAug 20, 03Mar 22, 05[H01J, G01N]
6850593 Fluorescent X-ray analysis apparatusExpiredMar 20, 00Feb 01, 05[G01N]
6838685 Ion beam apparatus, ion beam processing method and sample holder memberExpiredJul 29, 03Jan 04, 05[H01J]
6825468 Fine stencil structure correction deviceExpiredJul 02, 03Nov 30, 04[H01J, G01N]
6817231 Scanning probe microscope for ultra sensitive electro-magnetic field detection and probe thereofExpiredDec 27, 02Nov 16, 04[G01B, G01R]
6810106 X-ray fluorescence thickness measurement deviceExpiredJul 27, 01Oct 26, 04[G01B]
6797952 Scanning atom probeExpiredJul 26, 02Sep 28, 04[G21K, G01N]
6798863 Combined x-ray analysis apparatusExpiredMay 16, 02Sep 28, 04[H01J, G01N]

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