HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Patent Owner
Stats
- 3 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Sep 08, 2009 most recent publication
Details
- 3 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 103 Total Citation Count
- Dec 15, 2000 Earliest Filing
- 11 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
Rank in Class
Top Patents (by citation)
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Recent Publications
- No Recent Publications to Display
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
7135861 Movable stage, XY stage, head carriage and tester of magnetic head or magnetic diskMar 19, 04Nov 14, 06[G01R]
7129702 XY stage, head carriage and tester of magnetic head or magnetic diskMar 19, 04Oct 31, 06[G01R]
7035039 Magnetic head positioning control device, magnetic head certifier, magnetic disk certifier and head cartridgeDec 05, 02Apr 25, 06[G11B]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
6962770 Method of manufacturing an electroconductive film, and an apparatus including itExpiredSep 14, 01Nov 08, 05[G03F]
6894489 TESTING APPARATUS FOR CONDUCTING A TEST ON A MAGNETIC RECORDING MEDIUM OR A MAGNETIC HEAD, THROUGH RECORDING TEST DATA ON THE MAGNETIC RECORDING MEDIUM AND REPRODUCING RECORDED TEST DATA THEREFROM BY MEANS OF THE MAGNETIC HEADExpiredDec 16, 03May 17, 05[G01R]
6887330 Machine for punching out electronic circuitry parts, method for replacing tape supply reels, and method for producing electronic circuitry parts from tapeExpiredJul 07, 03May 03, 05[B65H]
2005/0022,930 Substrate treatment apparatus, substrate treatment method and substrate manufacturing methodAbandonedMar 31, 04Feb 03, 05[C23F]
6821906 Method and apparatus for treating surface of substrate plateExpiredNov 20, 01Nov 23, 04[C23C, H01L, H05H]
2004/0196,454 Optical system, detector and method for detecting peripheral surface defect of translucent diskAbandonedApr 02, 04Oct 07, 04[G01N]
6801050 Driver circuit integrated with load current output circuit, pin electronics and IC tester having thereofExpiredDec 27, 01Oct 05, 04[G01R]
2002/0046,374 Method of testing memory device, method of manufacturing memory device, apparatus for testing memory device, method of testing memory module, method of manufacturing memory module, apparatus for testing memory module and method of manufacturing computerAbandonedDec 15, 00Apr 18, 02[G11C]
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