HIGH VOLTAGE ENGINEERING CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 8120
 
  
 
B23Q DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING 139
 
  
 
F16M FRAMES, CASINGS, OR BEDS, OF ENGINES OR OTHER MACHINES OR APPARATUS, NOT SPECIFIC TO AN ENGINE, MACHINE, OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS OR SUPPORTS134
 
  
 
H05H PLASMA TECHNIQUE 129

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7449682 System and method for depth profiling and characterization of thin filmsOct 24, 02Nov 11, 08[H01J]
5990476 Control of surface potential of insulating specimens in surface analysisNov 12, 97Nov 23, 99[H01J, H05H]
5637879 Focused ion beam column with electrically variable blanking apertureMar 20, 96Jun 10, 97[H01J]
5602899 Anode assembly for generating x-rays and instrument with such anode assemblyJan 31, 96Feb 11, 97[H01J]
5432345 Method and apparatus for control of surface potentialOct 08, 92Jul 11, 95[H01J]
5315113 Scanning and high resolution x-ray photoelectron spectroscopy and imagingSep 29, 92May 24, 94[H01J]
5218262 Apparatus for retaining an electrode by a magnetically shielded magnetApr 06, 92Jun 08, 93[H01J]
5213301 Suspension system for isolating vibrationsDec 17, 91May 25, 93[F16M]
5184525 Mechanism for positioning a carrierApr 15, 92Feb 09, 93[B23Q]
5118941 Apparatus and method for locating target area for electron microanalysisApr 23, 91Jun 02, 92[H01J]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2003/0080,291 System and method for characterization of thin filmsAbandonedOct 26, 01May 01, 03[G01N]
2003/0080,292 System and method for depth profilingAbandonedOct 26, 01May 01, 03[G01N]
5241152 Circuit for detecting and diverting an electrical arc in a glow discharge apparatusExpiredMar 23, 90Aug 31, 93[B23K]
5167748 Plasma etching method and apparatusExpiredSep 06, 90Dec 01, 92[H01L]
5128543 Particle analyzer apparatus and methodExpiredOct 23, 89Jul 07, 92[H01J]
5032724 Multichannel charged-particle analyzerExpiredAug 09, 90Jul 16, 91[H01J]
5025144 Resistive anode encoder target and method producing baths charged and visual imagesExpiredOct 06, 88Jun 18, 91[H01J]
4882487 Direct imaging monochromatic electron microscopeExpiredNov 08, 88Nov 21, 89[H01J]
4810880 Direct imaging monochromatic electron microscopeExpiredJun 05, 87Mar 07, 89[H01J]
4737639 Energy and analysis detection system for surface chemical analysisExpiredJun 24, 87Apr 12, 88[H01J]
4659899 Vacuum-compatible air-cooled plasma deviceExpiredFeb 26, 86Apr 21, 87[B23K]
4532816 Sample vesselExpiredJul 25, 83Aug 06, 85[G01N]
4488885 Electrostatic charging apparatusExpiredNov 01, 82Dec 18, 84[B03C]
4485428 High voltage pulse generatorExpiredMay 10, 82Nov 27, 84[H05F]
4432250 Hotwell sampling systemExpiredJul 06, 82Feb 21, 84[G01N]
4230947 Apparatus for treating flowable materialExpiredJul 02, 79Oct 28, 80[G01N]
4198590 High current triggered spark gapExpiredNov 16, 78Apr 15, 80[H01J]
4183736 Electrostatic precipitationExpiredAug 02, 76Jan 15, 80[B03C]

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