HERMES-MICROVISION (TAIWAN) INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 4124
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 3359
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 2204

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7474001 Method for in-line monitoring of via/contact holes etch process based on test structures in semiconductor wafer manufacturingJun 13, 06Jan 06, 09[H01L]
7105436 Method for in-line monitoring of via/contact holes etch process based on test structures in semiconductor wafer manufacturingJun 09, 04Sep 12, 06[H01L]
6960766 Swinging objective retarding immersion lens electron optics focusing, deflection and signal collection system and methodJun 20, 03Nov 01, 05[H01J]
6881956 Method and apparatus for scanning semiconductor wafers using a scanning electron microscopeAug 26, 03Apr 19, 05[G01N]
6815345 Method for in-line monitoring of via/contact holes etch process based on test structures in semiconductor wafer manufacturingNov 21, 02Nov 09, 04[H01L]
6791095 Method and system of using a scanning electron microscope in semiconductor wafer inspection with Z-stage focusMar 21, 02Sep 14, 04[H01J]
6710342 Method and apparatus for scanning semiconductor wafers using a scanning electron microscopeSep 22, 00Mar 23, 04[G01N]
6605805 Swinging objective retarding immersion lens electron optics focusing, deflection and signal collection system and methodMar 28, 02Aug 12, 03[H01J]
6392231 Swinging objective retarding immersion lens electron optics focusing, deflection and signal collection system and methodFeb 25, 00May 21, 02[H01J]

Expired/Abandoned/Withdrawn Patents

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