GSI LUMONICS CORPORATION
Patent Owner
Stats
- 7 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Aug 02, 2012 most recent publication
Details
- 7 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 2,332 Total Citation Count
- Jun 08, 1984 Earliest Filing
- 75 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
Rank in Class
Top Patents (by citation)
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Recent Publications
- No Recent Publications to Display
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
7382389 Methods and systems for thermal-based laser processing a multi-material deviceNov 07, 06Jun 03, 08[B41J]
5300756 Method for severing integrated-circuit connection paths by a phase-plate-adjusted laser beamOct 22, 91Apr 05, 94[B23K]
5235180 Rotary motor having an angular position transducer and galvanometer scanning system employing such motorMar 05, 92Aug 10, 93[G01D]
5225770 Moving magnet galvanometers having a varied density winding distribution coil for a desired performance characteristicFeb 25, 91Jul 06, 93[G01R]
5123024 Apparatus and method for controlling the light intensity of a laser diodeAug 06, 91Jun 16, 92[H01S]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2008/0316,504 Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking systemAbandonedOct 09, 06Dec 25, 08[G06F, G01B]
2007/0075,058 High-speed, precision, laser-based method and system for processing material of one or more targets within a fieldAbandonedDec 01, 06Apr 05, 07[B23K]
7190144 System and method for adjusting a PID controller in a limited rotation motor systemExpiredJan 21, 05Mar 13, 07[G05B]
2007/0031,993 Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking systemAbandonedOct 09, 06Feb 08, 07[H01L, B23K]
7170251 System and method for diagnosing a controller in a limited rotation motor systemExpiredJan 21, 05Jan 30, 07[G05B]
2006/0216,927 Methods and systems for processing a device, methods and systems for modeling same and the deviceAbandonedMay 26, 06Sep 28, 06[H01L]
2006/0207,975 High-speed, precision, laser-based method and system for processing material of one or more targets within a fieldAbandonedMay 02, 06Sep 21, 06[B23K]
2006/0186,096 High speed, laser-based marking method and system for producing machine readable marks on workpieces and semiconductor devices with reduced subsurface damage produced therebyAbandonedApr 18, 06Aug 24, 06[B23K]
2006/0180,580 High speed, laser-based marking method and system for producing machine readable marks on workpieces and semiconductor devices with reduced subsurface damage produced therebyAbandonedApr 18, 06Aug 17, 06[H01L, B23K]
2006/0054,608 Method and system for calibrating a laser processing system and laser marking system utilizing sameAbandonedNov 04, 05Mar 16, 06[B23K]
2005/0199,598 Method and system for precisely positioning a waist of a material-processing laser beam to process microstructures within a laser-processing siteAbandonedMay 10, 05Sep 15, 05[B23K]
2005/0177,330 System and method for optimizing character marking performanceAbandonedJan 21, 05Aug 11, 05[G01D]
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