FINESSE SOLUTIONS, LLC

Patent Owner

Watch Compare Add to Portfolio

Stats

Details

Patent Activity in the Last 10 Years

# of Matters
0
0

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 177
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361

Top Patents (by citation)

Upgrade to the Professional Level to View Top Patents for this Owner. Learn More

Recent Publications

  • No Recent Publications to Display

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7189594 Wafer level packages and methods of fabricationSep 10, 04Mar 13, 07[H01L]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2009/0104,653 Bio-process model predictions from optical loss measurementsAbandonedOct 23, 07Apr 23, 09[C12Q]
2008/0282,026 Bioprocess data managementAbandonedMay 01, 08Nov 13, 08[G06F]
2008/0144,007 Thermal lens spectroscopy for ultra-sensitive absorption measurementAbandonedNov 30, 07Jun 19, 08[G01J, G01N]
2008/0114,550 Cell density fitting equationAbandonedFeb 06, 07May 15, 08[G01N]

Top Inventors for This Owner

Upgrade to the Professional Level to View Top Inventors for this Owner. Learn More

We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.