FEI EFA, INC.

Patent Owner

Watch Compare Add to Portfolio

Stats

Details

Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 9150
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 3203
 
  
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]315
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 276
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 2203
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1446
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 1197
 
  
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 1134
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 1241

Top Patents (by citation)

Upgrade to the Professional Level to View Top Patents for this Owner. Learn More

Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0003,336 DIAMOND DELAYERING FOR ELECTRICAL PROBINGJun 14, 16Jan 05, 17[G01Q, G01R]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9915700 System and method for modulation mappingJan 15, 16Mar 13, 18[G01R]
9903824 Spectral mapping of photo emissionApr 08, 15Feb 27, 18[G01N, G06F, G01R]
9905014 Method and system for the examination of a sample by means of thermographyNov 13, 13Feb 27, 18[G01J, H04N, G06T, G01N, G06K]
9891280 Probe-based data collection system with adaptive mode of probing controlled by local sample propertiesDec 02, 16Feb 13, 18[G01Q, G01R]
9885878 Apparatus and method for annular optical power managementApr 10, 14Feb 06, 18[G02B]
9869696 Method for imaging a feature using a scanning probe microscopeFeb 03, 16Jan 16, 18[G01Q]
9816866 Method for examination of a sample by means of the heat flow thermographyDec 10, 12Nov 14, 17[G01J, G01N]
9817060 Optimized wavelength photon emission microscope for VLSI devicesApr 10, 14Nov 14, 17[G01R]
6985219 Optical coupling for testing integrated circuitsDec 21, 00Jan 10, 06[G01N]

Expired/Abandoned/Withdrawn Patents

  • No Patents to Display

Top Inventors for This Owner

Upgrade to the Professional Level to View Top Inventors for this Owner. Learn More

We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.