ELMOS SEMICONDUCTOR AG

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 13349
 
  
 
G01L MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE 1244
 
  
 
B81C PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICRO-STRUCTURAL DEVICES OR SYSTEMS 824
 
  
 
B81B MICRO-STRUCTURAL DEVICES OR SYSTEMS, e.g. MICRO-MECHANICAL DEVICES 726
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 771
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 6153
 
  
 
G01S RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES6103
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 5442
 
  
 
H02P CONTROL OR REGULATION OF ELECTRIC MOTORS, GENERATORS, OR DYNAMO-ELECTRIC CONVERTERS; CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS 582
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 4201

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9910269 MEMS scanning micromirrorNov 28, 12Mar 06, 18[B81C, G02B, B81B]
9829382 Device for operating passive infrared sensorsOct 21, 13Nov 28, 17[G08B, G01J, H03M]
9686830 Device for supplying light sources with energy in a manner extending service lifeJul 24, 14Jun 20, 17[H05B]
9658323 Method for measuring a transmission path by means of compensating amplitude measurement and delta-sigma method, and device for implementing the methodJun 04, 14May 23, 17[G01S]
9588337 MEMS scanning micromirrorOct 10, 12Mar 07, 17[G02B, B81B]
9577750 Multifunctional micro sensor systemFeb 07, 14Feb 21, 17[H04B, G01S, H04J]
9520953 Method and sensor system for measuring the properties of a transmission path of a measuring system between a transmitter and a receiverAug 22, 14Dec 13, 16[H04B, G01S, H04J]
9435699 Method for producing a microelectromechanical device and microelectromechanical deviceApr 17, 15Sep 06, 16[H01L, G01L, B81C]
9411046 Device and method for generating and evaluating ultrasound signals, particularly for determining the distance of a vehicle from an obstacleJun 17, 13Aug 09, 16[G01S]
9403676 Semiconductor componentFeb 13, 15Aug 02, 16[H01L, G01L, B81C, B81B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0312,069 ELECTRICAL APPARATUS FOR TRANSMITTING ELECTRICAL ENERGY IN A CLOCKED MANNERAbandonedNov 04, 13Oct 29, 15[H04L]
2013/0134,476 SOLID-STATE DIODEAbandonedJul 12, 12May 30, 13[H01L]
6775767 Method for automatically assigning addresses to the participating units of a bus systemExpiredApr 18, 01Aug 10, 04[G06F]
2001/0002,594 Method and device for removing deposits from the ends of contacting needles of semiconductor test devices and use of a substrate for this purposeAbandonedDec 06, 00Jun 07, 01[B08B]

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