DUET TECHNOLOGIES, INC.
Patent Owner
Stats
- 0 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Aug 25, 1998 most recent publication
Details
- 0 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 502 Total Citation Count
- Mar 10, 1986 Earliest Filing
- 17 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
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Recent Publications
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Recent Patents
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Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
5799021 Method for direct access test of embedded cells and customization logicExpiredMar 20, 97Aug 25, 98[G01R]
5436801 Method and structure for routing power for optimum cell utilization with two and three level metal in a partially predesigned integrated circuitExpiredSep 09, 93Jul 25, 95[H01R]
5230001 Method for testing a sequential circuit by splicing test vectors into sequential test patternExpiredMar 08, 91Jul 20, 93[G06F, G01R]
5206862 Method and apparatus for locally deriving test signals from previous response signalsExpiredMar 08, 91Apr 27, 93[G01R]
5202624 Interface between IC operational circuitry for coupling test signal from internal test matrixExpiredAug 12, 91Apr 13, 93[G01R]
5179534 Method and apparatus for setting desired logic state at internal point of a select storage elementExpiredOct 23, 90Jan 12, 93[G11C]
5157627 Method and apparatus for setting desired signal level on storage elementExpiredJul 17, 90Oct 20, 92[G11C]
5065090 Method for testing integrated circuits having a grid-based, "cross-check" teExpiredJul 13, 88Nov 12, 91[G01R]
5037771 Method for implementing grid-based crosscheck test structures and the structures resulting therefromExpiredNov 28, 89Aug 06, 91[H01L]
5038349 Method for reducing masking of errors when using a grid-based, "cross-check" test structureExpiredAug 25, 89Aug 06, 91[G01R]
4975640 Method for operating a linear feedback shift register as a serial shift register with a crosscheck grid structureExpiredFeb 20, 90Dec 04, 90[H03K, G06F]
4937826 Method and apparatus for sensing defects in integrated circuit elementsExpiredSep 09, 88Jun 26, 90[G06F]
4749947 Grid-based, "cross-check" test structure for testing integrated circuitsExpiredMar 10, 86Jun 07, 88[G01R]
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