DCG SYSTEMS, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 51108
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 13115
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 12194
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 11351
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 10195
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 9438
 
  
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]612
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS594
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 5193
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 474

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0003,336 DIAMOND DELAYERING FOR ELECTRICAL PROBINGJun 14, 16Jan 05, 17[G01Q, G01R]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9551743 Apparatus and method for combined micro-scale and nano-scale C-V, Q-V, and I-V testing of semiconductor materialsFeb 16, 12Jan 24, 17[G01Q, G01R]
9506947 System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobingNov 24, 14Nov 29, 16[G02B, G01Q]
9361533 Apparatus and method for polarization diversity imaging and alignmentNov 16, 12Jun 07, 16[G02B, G06K]
9322715 Three-dimensional hot spot localizationJun 02, 14Apr 26, 16[G01J, G01N, G01R]
9244121 Systems and method for laser voltage imaging state mappingJun 17, 14Jan 26, 16[G01R]
9239357 System and method for modulation mappingOct 22, 12Jan 19, 16[G01R]
9201096 Laser-assisted device alteration using synchronized laser pulsesMay 16, 13Dec 01, 15[G01R]
9098892 Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite sideApr 02, 14Aug 04, 15[H04N, G06T, G01N, G01R]
9064083 P and N region differentiation for image-to-CAD alignmentAug 07, 13Jun 23, 15[G06F, G03F]
9057740 Probe-based data collection system with adaptive mode of probingDec 16, 13Jun 16, 15[G21K, G01Q]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2016/0370,425 Particle Beam Heating to Identify DefectsAbandonedMar 19, 16Dec 22, 16[G01R]
2016/0139,200 SYSTEMS AND METHOD FOR LASER VOLTAGE IMAGING STATE MAPPINGAbandonedJan 21, 16May 19, 16[G01J, G01R]
2015/0377,958 APPARATUS AND METHOD FOR NANOPROBING OF ELECTRONIC DEVICESAbandonedJun 25, 15Dec 31, 15[G01R]
2015/0338,458 LOCK IN THERMAL LASER STIMULATION THROUGH ONE SIDE OF THE DEVICE WHILE ACQUIRING LOCK-IN THERMAL EMISSION IMAGES ON THE OPPOSITE SIDEAbandonedAug 03, 15Nov 26, 15[G01J, H04N, G06T, G01R]
2015/0146,424 LED LIGHTING DEVICEAbandonedJun 21, 13May 28, 15[F21V]
2014/0380,531 PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CONTROLLED BY LOCAL SAMPLE PROPERTIESAbandonedJun 24, 14Dec 25, 14[G01Q]
2014/0191,111 ACCUMULATING OPTICAL DETECTOR WITH SHUTTER EMULATIONAbandonedDec 04, 13Jul 10, 14[H01L, G01N]
8645896 Method to transfer failure analysis-specific data between design houses and fab's/FA labsExpiredSep 14, 11Feb 04, 14[G06F]
8076951 Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysisExpiredMar 11, 09Dec 13, 11[G01R]
2010/0039,117 TEMPERATURE CONTROL SYSTEM FOR A DEVICE UNDER TESTAbandonedAug 11, 09Feb 18, 10[F28F, G01R]
2009/0007,033 Method to transfer failure analysis-specific data between data between design houses and fab's/FA labsAbandonedJun 28, 07Jan 01, 09[G06F]
2008/0298,719 SUB-RESOLUTION ALIGNMENT OF IMAGESAbandonedJun 23, 08Dec 04, 08[G06K]
7439168 Apparatus and method of forming silicide in a localized mannerExpiredOct 12, 04Oct 21, 08[H01L]
2008/0113,455 Planar etching of dissimilar materialsAbandonedJun 28, 07May 15, 08[H01L, G05D]
2008/0090,403 APPARATUS AND METHOD FORMING A CONTACT TO SILICIDE AND A CONTACT TO A CONTACTAbandonedOct 02, 06Apr 17, 08[H01L]
2008/0078,506 RF Coil Plasma GenerationAbandonedSep 29, 06Apr 03, 08[C23F]
2008/0078,745 RF Coil Plasma GenerationAbandonedSep 29, 06Apr 03, 08[H01L, C23F]
2008/0028,345 APPARATUS AND METHOD FOR INTEGRATED CIRCUIT DESIGN FOR CIRCUIT EDITAbandonedOct 09, 07Jan 31, 08[H01L, G06F]
7314767 Method for local wafer thinning and reinforcementExpiredMay 27, 05Jan 01, 08[H01L]
2007/0290,702 System and method for thermal management and gradient reductionAbandonedJun 19, 06Dec 20, 07[G01R]

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