CYBEROPTICS CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS1881
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 11231
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 8198
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 6192
 
  
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 5130
 
  
 
B23P OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS 254
 
  
 
F21V FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR 2108
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 276
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 2445
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 2154

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0264,885 FIELD CALIBRATION OF THREE-DIMENSIONAL NON-CONTACT SCANNING SYSTEMMar 10, 17Sep 14, 17[F16M, H04N, G06T, G01B]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9816287 Updating calibration of a three-dimensional measurement systemDec 21, 15Nov 14, 17[H04N, B29C, B29L, E04H]
9743527 Stencil programming and inspection using solder paste inspection systemAug 06, 14Aug 22, 17[G06F, B25J, H05K]
8894259 Dark field illuminator with large working areaSep 22, 09Nov 25, 14[F21V]
8872912 High speed distributed optical sensor inspection systemNov 05, 10Oct 28, 14[H04N, G01N, G06K, H05K]
8823933 Substrate-like particle sensorSep 27, 07Sep 02, 14[G01N]
8681211 High speed optical inspection system with adaptive focusingNov 04, 10Mar 25, 14[H04N, G06K]
8670031 High speed optical inspection system with camera array and compact, integrated illuminatorSep 21, 10Mar 11, 14[H04N, G06K]
8388204 High speed, high resolution, three dimensional solar cell inspection systemSep 21, 10Mar 05, 13[F21V]
8116909 Gantry position tracking using redundant position sensorsDec 30, 08Feb 14, 12[G06F]
8064068 Multi-source sensor for three-dimensional imaging using phased structured lightJan 23, 09Nov 22, 11[G01B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2014/0198,185 MULTI-CAMERA SENSOR FOR THREE-DIMENSIONAL IMAGING OF A CIRCUIT BOARDAbandonedJan 14, 14Jul 17, 14[H04N, G06T]
2012/0327,215 HIGH SPEED OPTICAL SENSOR INSPECTION SYSTEMAbandonedMay 24, 12Dec 27, 12[H04N, G06F]
2012/0133,920 HIGH SPEED, HIGH RESOLUTION, THREE DIMENSIONAL PRINTED CIRCUIT BOARD INSPECTION SYSTEMAbandonedDec 01, 11May 31, 12[G01P]
8068664 Component sensor for pick and place machine using improved shadow imagingExpiredJun 05, 08Nov 29, 11[G06K]
2011/0175,997 HIGH SPEED OPTICAL INSPECTION SYSTEM WITH MULTIPLE ILLUMINATION IMAGERYAbandonedJan 23, 09Jul 21, 11[H04N]
2010/0295,935 ON-HEAD COMPONENT ALIGNMENT USING MULTIPLE AREA ARRAY IMAGE DETECTORSAbandonedApr 28, 10Nov 25, 10[H04N]
2009/0229,118 Electronics Assembly Machine with Wireless Communication NozzleAbandonedMar 17, 08Sep 17, 09[G08B, H05K]
7559134 Pick and place machine with improved component placement inspectionExpiredOct 21, 04Jul 14, 09[B23P]
7555831 Method of validating component feeder exchangesExpiredMay 18, 05Jul 07, 09[B23P]
2009/0135,251 METHOD AND APPARATUS FOR EVALUATING A COMPONENT PICK ACTION IN AN ELECTRONICS ASSEMBLY MACHINEAbandonedFeb 02, 09May 28, 09[H04N]
2009/0133,249 METHOD AND APPARATUS FOR EVALUATING A COMPONENT PICK ACTION IN AN ELECTRONICS ASSEMBLY MACHINEAbandonedFeb 02, 09May 28, 09[H04N, H05K]
2009/0046,921 PICK AND PLACE MACHINE WITH IMPROVED COMPONENT PICK UP INSPECTIONAbandonedOct 29, 08Feb 19, 09[B23P, G06F, G06K]
2008/0199,068 Inspection SystemAbandonedJan 10, 08Aug 21, 08[G06K]
7346419 Component feeder exchange diagnostic toolExpiredJan 30, 07Mar 18, 08[G06F]
7346420 Component feeder exchange diagnostic toolExpiredJan 30, 07Mar 18, 08[G06F]
2008/0013,104 Pick and place machine with improved component placement inspectionAbandonedAug 27, 07Jan 17, 08[G01B]
2007/0276,867 Embedded inspection image archival for electronics assembly machinesAbandonedMay 23, 06Nov 29, 07[G06F]
7239399 Pick and place machine with component placement inspectionExpiredNov 08, 02Jul 03, 07[G01B]
2007/0130,755 Electronics assembly machine with embedded solder paste inspectionAbandonedOct 31, 06Jun 14, 07[B23K]
2007/0120,977 Pick and place machine with component placement inspectionAbandonedJan 18, 07May 31, 07[H04N, G06K]

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