CHARTERED SEMICONDUCTOR MANUFACTURING LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 52596
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 1688
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 11436
 
  
 
H01F MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES 1074
 
  
 
B24B MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING 759
 
  
 
G03C PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES 640
 
  
 
B05D PROCESSES FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL 582
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 4155
 
  
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 355
 
  
 
C23C COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL 398

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2004/0005,781 HDP SRO liner for beyond 0.18 um STI gap-fillJul 02, 02Jan 08, 04[H01L]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9165920 Tunable protection system for integrated circuitsOct 15, 05Oct 20, 15[H01L]
9147654 Integrated circuit system employing alternating conductive layersJul 07, 08Sep 29, 15[H01L]
8920097 Wafer handling system for a loadlockNov 01, 07Dec 30, 14[H01L]
8685861 Integrated circuit system with contact distribution filmAug 02, 06Apr 01, 14[H01L]
8643119 Substantially L-shaped silicide for contactJul 30, 08Feb 04, 14[H01L]
8455350 Integrated circuit system employing gate shield and/or ground shieldAug 18, 06Jun 04, 13[H01L]
8350235 Semiconductor intra-field dose correctionJul 27, 09Jan 08, 13[G21K]
8338245 Integrated circuit system employing stress-engineered spacersMar 14, 08Dec 25, 12[H01L]
8236646 Non-volatile memory manufacturing method using STI trench implantationNov 06, 03Aug 07, 12[H01L]
8236699 Contact patterning method with transition etch feedbackFeb 07, 11Aug 07, 12[H01L]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
8623714 Spacer protection and electrical connection for array deviceExpiredMar 22, 10Jan 07, 14[H01L]
8461009 Spacer and process to enhance the strain in the channel with stress linerExpiredFeb 28, 06Jun 11, 13[H01L]
2012/0074,519 CRACK STOP STRUCTURE ENHANCEMENT OF THE INTEGRATED CIRCUIT SEAL RINGAbandonedSep 26, 11Mar 29, 12[H01L]
8138053 Method of forming source and drain of field-effect-transistor and structure thereofExpiredJun 15, 07Mar 20, 12[H01L]
8106462 Balancing NFET and PFET performance using straining layersExpiredJan 14, 10Jan 31, 12[H01L]
2011/0278,645 STRAIN-DIRECT-ON-INSULATOR (SDOI) SUBSTRATE AND METHOD OF FORMINGAbandonedJul 26, 11Nov 17, 11[H01L]
8026166 Interconnect structures comprising capping layers with low dielectric constants and methods of making the sameExpiredAug 12, 08Sep 27, 11[H01L]
2011/0006,349 FIELD EFFECT TRANSISTOR HAVING CHANNEL SILICON GERMANIUMAbandonedJul 13, 09Jan 13, 11[H01L]
7816909 Mechanical stress characterization in semiconductor deviceExpiredJul 29, 08Oct 19, 10[G01R]
2010/0206,818 ULTRASONIC FILTRATION FOR CMP SLURRYAbandonedFeb 19, 09Aug 19, 10[B01D]
7759206 Methods of forming semiconductor devices using embedded L-shape spacersExpiredNov 29, 05Jul 20, 10[H01L]
2010/0109,045 INTEGRATED CIRCUIT SYSTEM EMPLOYING STRESS-ENGINEERED LAYERSAbandonedOct 30, 08May 06, 10[H01L]
2010/0109,155 RELIABLE INTERCONNECT INTEGRATIONAbandonedNov 05, 08May 06, 10[H01L]
2010/0096,695 HIGH STRESS FILMAbandonedOct 16, 08Apr 22, 10[H01L]
2010/0038,752 MODULAR & SCALABLE INTRA-METAL CAPACITORSAbandonedAug 15, 08Feb 18, 10[H01L, H01G]
2010/0013,003 NON-VOLATILE MEMORY CELL WITH A HYBRID ACCESS TRANSISTORAbandonedSep 24, 09Jan 21, 10[H01L]
2010/0009,527 INTEGRATED CIRCUIT SYSTEM EMPLOYING SINGLE MASK LAYER TECHNIQUE FOR WELL FORMATIONAbandonedJul 14, 08Jan 14, 10[H01L]
2009/0325,359 INTEGRATED CIRCUIT SYSTEM EMPLOYING A MODIFIED ISOLATION STRUCTUREAbandonedJun 30, 08Dec 31, 09[H01L]
2009/0315,121 STABLE STRESS DIELECTRIC LAYERAbandonedJun 19, 08Dec 24, 09[H01L]
2009/0302,401 PFET ENHANCEMENT DURING SMTAbandonedJun 05, 08Dec 10, 09[H01L]

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