Carl Zeiss Microscopy, LLC

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 2999
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 442
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 2204
 
  
 
B82Y SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES251
 
  
 
A61N ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY 1106
 
  
 
B03C MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLID MATERIALS OR FLUIDS; SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS 120
 
  
 
G01K MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 145
 
  
 
G01T MEASUREMENT OF NUCLEAR OR X-RADIATION 151
 
  
 
G05D SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES 183
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 1241

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9640364 Charged particle beam system and method of operating a charged particle beam systemDec 15, 15May 02, 17[H01J]
9627172 Charged particle beam system and method of operating a charged particle beam systemDec 15, 15Apr 18, 17[H01J]
9536699 Charged particle beam system and method of operating a charged particle beam systemJun 25, 14Jan 03, 17[H01J, G21K]
9530611 Charged particle beam system and method of operating a charged particle beam systemJun 25, 14Dec 27, 16[H01J]
9530612 Charged particle beam system and method of operating a charged particle beam systemJun 25, 14Dec 27, 16[H01J, G21K]
9236225 Ion sources, systems and methodsApr 13, 15Jan 12, 16[H01J, B82Y]
9218934 Charged particle beam system and method of operating a charged particle beam systemJun 25, 14Dec 22, 15[H01J, G21K]
9218935 Charged particle beam system and method of operating a charged particle beam systemJun 25, 14Dec 22, 15[H01J, G21K]
9159527 Systems and methods for a gas field ionization sourceApr 10, 08Oct 13, 15[H01J]
9123502 Scan methodSep 20, 11Sep 01, 15[H01J, H04N]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2013/0118,184 COOLED CHARGED PARTICLE SYSTEMS AND METHODSAbandonedJun 04, 12May 16, 13[F17C]
2011/0180,722 ALIGNING CHARGED PARTICLE BEAMSAbandonedAug 12, 09Jul 28, 11[H01J]
2011/0127,428 ELECTRON DETECTION SYSTEMS AND METHODSAbandonedMay 26, 09Jun 02, 11[G01N]

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