BRUKER NANO, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS9822
 
  
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]501
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 30176
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 27101
 
  
 
B82Y SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES1241
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 11194
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 7152
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 5442
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 4194
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 4238

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0227,577 Force Measurement with Real-Time Baseline DeterminationFeb 21, 17Aug 10, 17[G01Q]
2017/0067,934 SNOM SYSTEM WITH LASER-DRIVEN PLASMA SOURCESep 02, 16Mar 09, 17[G01Q]
2016/0178,659 Method and Apparatus of Electrical Property Measurement Using an AFM Operating in Peak Force Tapping ModeDec 15, 15Jun 23, 16[G01Q]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9910064 Force measurement with real-time baseline determinationFeb 21, 17Mar 06, 18[G01Q]
9869694 Method and apparatus of electrical property measurement using an AFM operating in peak force tapping modeDec 15, 15Jan 16, 18[B82Y, G01Q]
9846178 Chemical nano-identification of a sample using normalized near-field spectroscopyAug 18, 16Dec 19, 17[G01Q]
9810713 Method and apparatus of operating a scanning probe microscopeMar 01, 16Nov 07, 17[B82Y, G01Q]
9804043 Measurement of very low torque valuesJun 11, 16Oct 31, 17[G01L, G01N, G01B]
9752868 Optical measurement of lead angle of groove in manufactured partOct 08, 16Sep 05, 17[G05B, G01B]
9752969 Universal mechanical tester for measuring friction and wear characteristics of materialsApr 09, 15Sep 05, 17[G01K, G01N]
9746315 Side illumination in interferometryJun 08, 15Aug 29, 17[G01B]
9739799 Method and apparatus to compensate for deflection artifacts in an atomic force microscopeFeb 28, 14Aug 22, 17[G01Q]
9719916 PeakForce photothermal-based detection of IR nanoabsorptionSep 02, 16Aug 01, 17[B82Y, G01N, G01Q]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2016/0209,322 Peakforce Photothermal-Based Detection of IR NanoabsorptionAbandonedDec 08, 15Jul 21, 16[G01N, G01Q]
2016/0109,477 Method and Apparatus of Tuning a Scanning Probe MicroscopeAbandonedAug 24, 15Apr 21, 16[G01Q]
2016/0033,547 Method and Apparatus of Physical Property Measurement Using a Probe-Based Nano-Localized Light SourceAbandonedJun 09, 15Feb 04, 16[G01Q]
2015/0260,782 PREDICTING LED PARAMETERS FROM ELECTROLUMINESCENT SEMICONDUCTOR WAFER TESTINGAbandonedJun 01, 15Sep 17, 15[G01R]
2015/0226,766 APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPYAbandonedJul 05, 13Aug 13, 15[G01Q]
2012/0265,487 Method and Apparatus of Analyzing Sample Surface DataAbandonedMay 19, 11Oct 18, 12[G06F, G01B]
2012/0105,864 OPTICAL MEASUREMENT OF LEAD ANGLE OF GROOVE IN MANUFACTURED PARTAbandonedOct 29, 10May 03, 12[G01B]
8087288 Scanning stylus atomic force microscope with cantilever tracking and optical accessExpiredJun 09, 97Jan 03, 12[G01Q, G01B]
7979916 Preamplifying cantilever and applications thereofExpiredMay 26, 09Jul 12, 11[G01Q]
7891015 High-bandwidth actuator drive for scanning probe microscopyExpiredJul 31, 07Feb 15, 11[G01Q]
7478552 Optical detection alignment/tracking method and apparatusExpiredMar 21, 06Jan 20, 09[G01N, G01B]
7448798 Scanning thermal probe microscopeExpiredJun 18, 03Nov 11, 08[G01K]
7385405 Capacitance probe for thin dielectric film characterizationExpiredJan 19, 06Jun 10, 08[]
7370515 Probes for use in scanning probe microscopes and methods of fabricating such probesExpiredJun 21, 04May 13, 08[G01B]
7334460 Method and apparatus of manipulating a sampleExpiredMay 09, 06Feb 26, 08[G01B]
7219538 Balanced momentum probe holderExpiredFeb 28, 05May 22, 07[G01B]
7210330 Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated therebyExpiredAug 24, 06May 01, 07[G01B]
7143005 Image reconstruction methodExpiredSep 17, 04Nov 28, 06[G01B]
7096711 Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated therebyExpiredMay 12, 04Aug 29, 06[G01B]
7076996 Environmental scanning probe microscopeExpiredOct 31, 02Jul 18, 06[G01N]

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