BRUKER DALTONICS, INC.

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Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 6568
 
  
 
B01D SEPARATION 24110
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 4202
 
  
 
G01D MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 258
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 2445
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 244
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 1197
 
  
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 1284

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9899199 Mass spectrometer comprising a radio frequency ion guide having continuous electrodesJun 30, 16Feb 20, 18[H01J]
9899201 High dynamic range ion detector for mass spectrometersNov 09, 16Feb 20, 18[H01J]
9741552 Triple quadrupole mass spectrometry coupled to trapped ion mobility separationDec 22, 15Aug 22, 17[H01J]
9721777 Magnetically assisted electron impact ion source for mass spectrometryApr 14, 16Aug 01, 17[H01J, G01N]
9425033 Ion injection device for a time-of-flight mass spectrometerJun 19, 14Aug 23, 16[H01J]
9401266 Filament for mass spectrometric electron impact ion sourceJul 25, 14Jul 26, 16[H01J]
9312113 Contamination-proof ion guide for mass spectrometryDec 09, 14Apr 12, 16[H01J]
9297786 Apparatus and method for cross-flow ion mobility spectrometryAug 18, 14Mar 29, 16[H01J, G01N]
9230786 Off-axis channel in electrospray ionization for removal of particulate matterJun 11, 14Jan 05, 16[H01J]
9184040 Abridged multipole structure for the transport and selection of ions in a vacuum systemJun 03, 11Nov 10, 15[H01J]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2016/0163,528 INTERFACE FOR AN ATMOSPHERIC PRESSURE ION SOURCE IN A MASS SPECTROMETERAbandonedDec 03, 14Jun 09, 16[H01J]
2013/0015,340 MULTIPOLE ASSEMBLY HAVING A MAIN MASS FILTER AND AN AUXILIARY MASS FILTERAbandonedFeb 06, 12Jan 17, 13[H01J]
2013/0015,344 BACKGROUND NOISE CORRECTION IN QUADRUPOLE MASS SPECTROMETERSAbandonedOct 31, 11Jan 17, 13[H01J]
2013/0009,050 ABRIDGED MULTIPOLE STRUCTURE FOR THE TRANSPORT, SELECTION, TRAPPING AND ANALYSIS OF IONS IN A VACUUM SYSTEMAbandonedMar 15, 12Jan 10, 13[H01J]
2007/0224,697 Means and method for analyzing samples by mass spectrometryAbandonedMar 24, 06Sep 27, 07[G01N]
7098451 Means and method for multiplexing sprays in an electrospray ionization sourceExpiredNov 05, 03Aug 29, 06[H01J]
2004/0195,503 Ion guide for mass spectrometersAbandonedApr 04, 03Oct 07, 04[H01J]
6797948 Multipole ion guideExpiredAug 10, 00Sep 28, 04[H01J]
2004/0023,410 Method and apparatus for continuous sample deposition on sample support plates for liquid chromatography-matrix-assisted laser desorption/ionization mass spectrometryAbandonedAug 05, 02Feb 05, 04[G01N]
2003/0108,876 Method for the application of FTMS to drug testingAbandonedDec 11, 01Jun 12, 03[C12Q, G01N, G06F]
6525313 Method and apparatus for an electrospray needle for use in mass spectrometryExpiredAug 16, 00Feb 25, 03[H01J, B01D]
2002/0190,204 Systems and method of a gated electrospray interface with variable flow rate for high throughput mass spectrometric analysisAbandonedJun 04, 02Dec 19, 02[H01J]
6469295 Multiple reflection time-of-flight mass spectrometerExpiredMar 30, 99Oct 22, 02[H01J, B01D]
6410914 Ionization chamber for atmospheric pressure ionization mass spectrometryExpiredMar 05, 99Jun 25, 02[H01J]
2001/0054,684 SURFACE INDUCED DISSOCIATION WITH PULSED ION EXTRACTIONAbandonedMay 29, 98Dec 27, 01[H01J, B01D]
5861623 N.sup.th order delayed extractionExpiredMay 10, 96Jan 19, 99[H01J, B01D]
5821534 Deflection based daughter ion selectorExpiredNov 22, 95Oct 13, 98[H01J]
5089702 ICR ion trapExpiredDec 12, 90Feb 18, 92[H01J]
5019706 Ion cyclotron resonance spectrometerExpiredMay 03, 90May 28, 91[H01J]
4924089 Method and apparatus for the accumulation of ions in a trap of an ion cyclotron resonance spectrometer, by transferring the kinetic energy of the motion parallel to the magnetic field into directions perpendicular to the magnetic fieldExpiredSep 29, 88May 08, 90[H01J]

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