APPLIED MATERIALS ISRAEL, LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 7957
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 76130
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 56142
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 26336
 
  
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 24111
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 18429
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS1782
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 17188
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 12147
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 1292

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0309,442 HIGH VOLTAGE ELECTRON BEAM SYSTEM AND METHODApr 13, 17Oct 26, 17[H01J]
2017/0309,444 DETECTION MODULE, INSPECTION SYSTEM AND A METHOD FOR OBTAINING MULTIPE SENSING RESULTSApr 20, 16Oct 26, 17[H01J]
2017/0243,343 TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRUCTUREDec 26, 16Aug 24, 17[G06T, G06K]
2016/0350,905 METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOFJun 02, 15Dec 01, 16[G06T, G06K]
2016/0189,055 TUNING OF PARAMETERS FOR AUTOMATIC CLASSIFICATIONDec 31, 14Jun 30, 16[G06N]
2013/0279,790 DEFECT CLASSIFICATION USING CAD-BASED CONTEXT ATTRIBUTESApr 19, 12Oct 24, 13[G06K]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9922796 Method for inspecting a specimen and charged particle multi-beam deviceDec 01, 16Mar 20, 18[H01J]
9916652 Technique for measuring overlay between layers of a multilayer structureDec 26, 16Mar 13, 18[G06T, G06K]
9911571 High voltage electron beam system and methodApr 13, 17Mar 06, 18[H01J, G01F]
9904995 System and method for patch based inspectionDec 09, 15Feb 27, 18[G06T, G06K]
9899185 Resolving ambiguities in an energy spectrumApr 20, 16Feb 20, 18[H01J]
9880550 Updating of a recipe for evaluating a manufacturing stage of an electrical circuitMar 24, 15Jan 30, 18[G05B]
9881765 Method and system for scanning an objectApr 20, 16Jan 30, 18[H01J]
9869582 Method and device for control of avalanche photo-diode characteristics for high speed and high gain applicationsNov 20, 15Jan 16, 18[H01L, G01J, H04B]
9858658 Defect classification using CAD-based context attributesApr 19, 12Jan 02, 18[G06T]
9851714 Method of inspecting a specimen and system thereofJun 02, 15Dec 26, 17[G06T, G05B, G06K]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0310,600 SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFICATION WITHIN INSPECTION IMAGESAbandonedJul 06, 15Oct 29, 15[G06T, G01N]
2014/0079,311 SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFICATIONAbandonedSep 20, 12Mar 20, 14[G06K]
2013/0148,115 OPTICAL SYSTEM AND METHOD FOR INSPECTION OF PATTERNED SAMPLESAbandonedDec 12, 11Jun 13, 13[G01N]
2011/0163,229 HIGH THROUGHPUT SEM TOOLAbandonedFeb 22, 08Jul 07, 11[H01J, G01N]
7973919 High resolution wafer inspection systemExpiredApr 01, 10Jul 05, 11[G01N]
7846649 High resolution printer and a method for high resolution printingExpiredSep 13, 04Dec 07, 10[G03C]
7842935 Raster frame beam system for electron beam lithographyExpiredJul 17, 06Nov 30, 10[H01J]
7844103 Microscopic inspection apparatus for reducing image smear using a pulsed light source and a linear-periodic superpositioned scanning scheme to provide extended pulse duration, and methods useful thereforExpiredOct 12, 06Nov 30, 10[G06K]
7796807 Optical inspection apparatus for substrate defect detectionExpiredJan 15, 09Sep 14, 10[G06K]
7668702 Method, system and medium for controlling manufacturing process using adaptive models based on empirical dataExpiredMar 04, 03Feb 23, 10[G06F]
2009/0256,075 Charged Particle Inspection Method and Charged Particle SystemAbandonedSep 06, 06Oct 15, 09[G01K, G01N]
2009/0159,810 Particle-Optical ComponentAbandonedNov 28, 06Jun 25, 09[H01J]
7518391 Probe card and a method for detecting defects using a probe card and an additional inspectionExpiredFeb 15, 05Apr 14, 09[G01R]
7499583 Optical inspection method for substrate defect detectionExpiredMay 24, 04Mar 03, 09[G06K]
7473911 Specimen current mapperExpiredOct 27, 03Jan 06, 09[H01J]
7433053 Laser inspection using diffractive elements for enhancement and suppression of surface featuresExpiredAug 08, 02Oct 07, 08[G01B]
7381978 Contact opening metrologyExpiredFeb 03, 05Jun 03, 08[H01J]
2008/0054,166 DETACHABLY COUPLED IMAGE INTENSIFIER AND IMAGE SENSORAbandonedOct 30, 07Mar 06, 08[H01J]
7315364 System for inspecting a surface employing configurable multi angle illumination modesExpiredMay 05, 05Jan 01, 08[G01N]
7239389 Determination of irradiation parameters for inspection of a surfaceExpiredJul 29, 04Jul 03, 07[G01J]

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