ADVANTEST CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology MATTERS Rank in Class
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 567 9
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 181 270
 
 
G11C STATIC STORES 71 86
 
 
H03M CODING, DECODING OR CODE CONVERSION, IN GENERAL 58 57
 
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 52 79
 
 
H04B TRANSMISSION 47 158
 
 
H03K PULSE TECHNIQUE 45 91
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 42 156
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 42 312
 
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 40 94
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Top Patents (by citation)

Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0014,738 MAGNETIC FIELD MEASUREMENT APPARATUS AND METHOD FOR NOISE ENVIRONMENT Jul 10, 17 Jan 18, 18 [G01R, G01F, A61B]
2018/0017,620 METHOD FOR OPERATING A TEST APPARATUS AND A TEST APPARATUS Sep 27, 17 Jan 18, 18 [G01R]
2018/0011,171 CHARACTERIZATION OF PHASE SHIFTER CIRCUITRY IN INTEGRATED CIRCUITS (ICs) USING STANDARD AUTOMATED TEST EQUIPMENT (ATE) Jul 11, 16 Jan 11, 18 [G01S]
2018/0003,736 METHOD AND APPARATUS FOR SOCKET POWER CALIBRATION WITH FLEXIBLE PRINTED CIRCUIT BOARD Jun 29, 16 Jan 04, 18 [G01R]
2017/0365,667 EPITAXIAL SUBSTRATE May 10, 17 Dec 21, 17 [H01L]
2017/0365,689 MANUFACTURING METHOD FOR COMPOUND SEMICONDUCTOR DEVICE May 10, 17 Dec 21, 17 [H01L]
2017/0322,252 TEST EQUIPMENT, METHOD FOR OPERATING A TEST EQUIPMENT AND COMPUTER PROGRAM Jun 16, 17 Nov 09, 17 [G01R]
2017/0281,028 PULSE WAVE SENSOR UNIT Sep 02, 15 Oct 05, 17 [A61B]
2017/0257,107 REMOVAL OF SAMPLING CLOCK JITTER INDUCED IN AN OUTPUT SIGNAL OF AN ANALOG-TO-DIGITAL CONVERTER May 24, 17 Sep 07, 17 [H03M]
2017/0228,301 SCHEDULER Apr 24, 17 Aug 10, 17 [G01R, G06F]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9882550 Wireless power transmitting apparatus and wireless power supply system Sep 30, 14 Jan 30, 18 [H03J, H01F, H04B, H02J]
9874605 Device holder, inner unit, outer unit, and tray Mar 16, 15 Jan 23, 18 [G01R]
9869702 Current measurement circuit Oct 28, 15 Jan 16, 18 [G01R, H03F, C12Q, G01N, G05F, B82Y]
9871413 Wireless power receiving apparatus Feb 19, 15 Jan 16, 18 [H01F, H02M, H02J]
9871788 Authentication terminal Oct 06, 15 Jan 16, 18 [H04L]
9871789 Authentication system, authentication method and service providing system Oct 06, 15 Jan 16, 18 [H04L]
9857424 Automated test equipment, instruction provider for providing a sequence of instructions, method of providing signal to a device under test, method for providing a sequence of instructions and test system Feb 05, 16 Jan 02, 18 [G01R]
9859099 Exposure apparatus and exposure method Feb 25, 16 Jan 02, 18 [H01J]
9846120 Light measurement apparatus, method, program and recording medium Aug 22, 13 Dec 19, 17 [G01J, G01N]
9847843 Apparatus and method for wireless testing of a plurality of transmit paths and a plurality of receive paths of an electronic device Aug 28, 09 Dec 19, 17 [G01R, G01D, H04B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0220,706 SYSTEMS, METHODS AND APPARATUS THAT EMPLOY STATISTICAL ANALYSIS OF STRUCTURAL TEST INFORMATION TO IDENTIFY YIELD LOSS MECHANISMS ABAN Sep 13, 10 Aug 03, 17 [G06F]
2016/0187,413 CABLE ASSEMBLY, CONNECTOR AND SEMICONDUCTOR TESTER ABAN Sep 25, 15 Jun 30, 16 [G01R, H01R]
2015/0323,452 DYNAMIC MEASUREMENT OF MATERIAL PROPERTIES USING TERAHERTZ RADIATION WITH REAL-TIME THICKNESS MEASUREMENT FOR PROCESS CONTROL ABAN Jul 17, 14 Nov 12, 15 [G01B, G01N]
2015/0312,059 COMPENSATING CIRCUIT, INFORMATION PROCESSING APPARATUS, COMPENSATION METHOD, AND COMPUTER READABLE STORAGE MEDIUM ABAN Apr 03, 15 Oct 29, 15 [H04L, H04B]
2015/0276,858 TEST APPARATUS AND CIRCUIT SUBSTRATE UNIT ABAN Mar 26, 14 Oct 01, 15 [G01R]
2015/0257,740 BODY FAT DIAGNOSTIC APPARATUS ABAN Feb 27, 15 Sep 17, 15 [A61B]
2015/0255,175 MEMORY TESTING AND FAILURE DATA FILTERING ABAN Mar 26, 14 Sep 10, 15 [G11C]
2015/0168,448 TEST CARRIER ABAN May 21, 13 Jun 18, 15 [G01R]
2015/0153,389 SOCKET AND ELECTRONIC DEVICE TEST APPARATUS ABAN Feb 10, 15 Jun 04, 15 [G01R]
2015/0130,493 ELECTRONIC DEVICE TESTING APPARATUS, ELECTRONIC DEVICE HOUSING APPARATUS, ELECTRONIC DEVICE RETRIEVING APPARATUS, AND ELECTRONIC DEVICE TESTING METHOD ABAN May 21, 13 May 14, 15 [G01R]
2015/0102,832 CARRIER DISASSEMBLING APPARATUS, ELECTRONIC DEVICE HOUSING APPARATUS, ELECTRONIC DEVICE RETRIEVING APPARATUS, AND ELECTRONIC DEVICE TESTING APPARATUS ABAN May 21, 13 Apr 16, 15 [G01R]
2015/0061,717 TEST CARRIER, DEFECT DETERMINATION APPARATUS, AND DEFECT DETERMINATION METHOD ABAN May 21, 13 Mar 05, 15 [G01R]
2015/0053,671 MICROWAVE FREQUENCY SETTING DEVICE, MICROWAVE FREQUENCY SETTING METHOD, AND RECORDING MEDIUM ABAN Jul 29, 14 Feb 26, 15 [H05B]
2015/0038,813 PHOTOACOUSTIC DIAGNOSIS DEVICE, METHOD, PROGRAM AND RECORDING MEDIUM ABAN May 02, 13 Feb 05, 15 [A61B]
2015/0015,284 TRANSMIT/RECEIVE UNIT, AND METHODS AND APPARATUS FOR TRANSMITTING SIGNALS BETWEEN TRANSMIT/RECEIVE UNITS ABAN Aug 14, 12 Jan 15, 15 [H04B]
2014/0361,790 DRIVE CIRCUIT, SWITCH APPARATUS, AND TEST APPARATUS ABAN Jun 11, 13 Dec 11, 14 [G01R, H02J]
2014/0336,974 Reconfigurable Automatic Test Circuit Techniques ABAN Jul 26, 14 Nov 13, 14 [G01R]
2014/0312,224 PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS ABAN Apr 16, 14 Oct 23, 14 [H01J]
2014/0309,516 PHOTOACOUSTIC WAVE MEASUREMENT INSTRUMENT ABAN Apr 04, 14 Oct 16, 14 [A61B]
2014/0237,292 GUI IMPLEMENTATIONS ON CENTRAL CONTROLLER COMPUTER SYSTEM FOR SUPPORTING PROTOCOL INDEPENDENT DEVICE TESTING ABAN Feb 21, 13 Aug 21, 14 [G06F]

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