ADVANCED MASK INSPECTION TECHNOLOGY INC.
Patent Owner
Stats
- 0 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Nov 27, 2008 most recent publication
Details
- 0 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 52 Total Citation Count
- Dec 12, 2005 Earliest Filing
- 11 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
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Recent Publications
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Recent Patents
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Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2008/0291,528 WAVELENGTH CONVERTER SYSTEM, CRYSTAL STORAGE APPARATUS, AND CRYSTAL REPLACEMENT METHOD OF WAVELENGTH CONVERTERAbandonedMay 21, 08Nov 27, 08[G02F]
2008/0204,737 MASK PATTERN INSPECTION APPARATUS WITH KOEHLER ILLUMINATION SYSTEM USING LIGHT SOURCE OF HIGH SPATIAL COHERENCYAbandonedFeb 22, 08Aug 28, 08[G01N]
2007/0165,938 Pattern inspection apparatus and method and workpiece tested therebyAbandonedMar 20, 06Jul 19, 07[G06K]
2007/0146,707 Pattern inspection apparatus and method along with workpiece tested thereby and management method of workpiece under testingAbandonedMar 20, 06Jun 28, 07[G01B]
2007/0064,998 Pattern inspection apparatus, pattern inspection method, and inspection sampleAbandonedJan 25, 06Mar 22, 07[G06K]
2007/0052,960 Reference image forming apparatus, pattern inspection apparatus, and reference image forming method, and reticleAbandonedDec 12, 05Mar 08, 07[G01B]
2007/0053,578 Pattern inspection apparatus and method and reticle for use thereinAbandonedDec 16, 05Mar 08, 07[G06K]
2007/0053,583 Image correcting apparatus, pattern inspection apparatus, and image correcting method, and reticleAbandonedDec 12, 05Mar 08, 07[G06K]
2006/0222,233 Pattern defect inspection method and apparatus using image correction techniqueAbandonedMar 23, 06Oct 05, 06[G06K]
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